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37. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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38. 
Cover image for The essence of logic circuits
The essence of logic circuits
Author 
Unger, Stephen H., 1931-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263200
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39. 
Cover image for Distributed operating systems concepts and design
Distributed operating systems concepts and design
Author 
Sinha, Pradeep K. (Pradeep Kumar)
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5487818
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40. 
Cover image for Wave propagation and scattering in random media
Wave propagation and scattering in random media
Author 
Ishimaru, Akira, 1928-
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270963
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