Limit Search Results
Author
SpringerLink (Online service)
(74)
Taylor and Francis.
(8)
Wiley InterScience (Online service)
(7)
Karwowski, Waldemar, 1953-
(4)
Dhillon, B. S. (Balbir S.), 1947, author.
(3)
Language
Publication Date
-
Subject
Electronic books.
(69)
TECHNOLOGY & ENGINEERING.
(20)
COMPUTERS.
(12)
Medical errors -- Prevention.
(11)
SCIENCE.
(11)
Material Type
Shelf Location
Switch to list view
Switch to thumbnail view
Select an Action
393 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Booher's rules of business grammar 101 fast and easy ways to correct the most common errors
Booher's rules of business grammar 101 fast and easy ways to correct the most common errors
Author 
Booher, Dianna Daniels.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Truth, errors, and lies : politics and economics in a volatile world
Truth, errors, and lies : politics and economics in a volatile world
Author 
Kołodko, Grzegorz W. Brand, William R.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://www.jstor.org/stable/10.7312/kolo15068
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Speed up your Spanish strategies to avoid common errors
Speed up your Spanish strategies to avoid common errors
Author 
Muñoz-Basols, Javier. David, Marianne. Núñez Piñeiro, Olga.
Preferred Shelf Number 
ONLINE
Electronic Access 
Click here to view
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Author 
Garg, Rajesh. author. Khatri, Sunil P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0931-2
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Functional Design Errors in Digital Circuits Diagnosis, Correction and Repair
Functional Design Errors in Digital Circuits Diagnosis, Correction and Repair
Author 
Chang, Kai-hui. author. Markov, Igor L. author. Bertacco, Valeria. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9365-4
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Advanced Potentiometry Potentiometric Titrations and Their Systematic Errors
Advanced Potentiometry Potentiometric Titrations and Their Systematic Errors
Author 
Néher-Neumann, Erzsébet. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9525-2
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Common errors in statistics (and how to avoid them)
Common errors in statistics (and how to avoid them)
Author 
Good, Phillip I. Hardin, James W. (James William)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468930
John Wiley http://dx.doi.org/10.1002/9780470473924
http://swb.eblib.com/patron/FullRecord.aspx?p=468930
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Verilog and SystemVerilog Gotchas 101 Common Coding Errors and How to Avoid Them
Author 
Sutherland, Stuart. author. Mills, Don. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71715-9
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Know the risk learning from errors and accidents : safety and risk in today's technology
Know the risk learning from errors and accidents : safety and risk in today's technology
Author 
Duffey, R. B. (Romney B.) Saull, John Walton, 1935-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750675963
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Common errors in statistics (and how to avoid them)
Common errors in statistics (and how to avoid them)
Author 
Good, Phillip I. Hardin, James W. (James William) John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
Book review (E-STREAMS) http://www.e-streams.com/es0709/es0709%5F3579.html
John Wiley http://dx.doi.org/10.1002/0471463760
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley046/2003043279.html
ebrary http://site.ebrary.com/id/10577644
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Intelligibility, tones and young beginner learners of Mandarin Chinese
Intelligibility, tones and young beginner learners of Mandarin Chinese
Author 
Neal, Robert (Chinese teacher), author.
Preferred Shelf Number 
PL1065
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003251286
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Parameter estimation of permanent magnet synchronous machines
Parameter estimation of permanent magnet synchronous machines
Author 
Zhu, Ziqiang, Ph. D., author. Liu, Kan (Dean), author. Liang, Dawei (Research associate), author.
Preferred Shelf Number 
QA276.8 .Z48 2025 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394280452
Format: 
Availability 
Online Library~1
Available:
Copies:
Select an Action