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37. 
Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
Author 
Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-8176-4804-6
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38. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03051-2
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39. 
Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Author 
Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71273-2
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40. 
Cover image for Microwave Circuit Theory and Foundations of Microwave Metrology
Microwave Circuit Theory and Foundations of Microwave Metrology
Author 
Engen, Glenn F.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL009E
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41. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
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42. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
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43. 
Cover image for Clinical and Laboratory Medicine Textbook
Clinical and Laboratory Medicine Textbook
Author 
Ciaccio, Marcello. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(522249.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-24958-7
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44. 
Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Author 
Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(519035.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19390-8
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45. 
Cover image for Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Author 
Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
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XX(519185.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-19941-2
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46. 
Cover image for Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Author 
Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(518392.1)
Electronic Access 
https://doi.org/10.1007/978-1-4471-6741-9
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47. 
Cover image for Optical devices in ophthalmology and optometry technology, design principles and clinical applications
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
Author 
Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.
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ONLINE(342196.1)
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John Wiley http://dx.doi.org/10.1002/9783527648962
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48. 
Cover image for Electrical impedance principles, measurement, and applications
Electrical impedance principles, measurement, and applications
Author 
Callegaro, Luca.
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