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37. 
Cover image for Elastic Waves at High Frequencies Techniques for Radiation and Diffraction of Elastic and Surface Waves
Elastic Waves at High Frequencies Techniques for Radiation and Diffraction of Elastic and Surface Waves
Author 
Harris, John G..
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38. 
Cover image for Theory of Edge Diffraction in Electromagnetics Origination and validation of the physical theory of diffraction
Theory of Edge Diffraction in Electromagnetics Origination and validation of the physical theory of diffraction
Author 
Ufimtsev, Pyotr Yakovlevich Terzuoli, Andrew J., ed.
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http://dx.doi.org/10.1049/SBEW054E
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39. 
Cover image for Fundamentals of Powder Diffraction and Structural Characterization of Materials
Fundamentals of Powder Diffraction and Structural Characterization of Materials
Author 
Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-09579-0
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40. 
Cover image for Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences
Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences
Author 
Gomez, Marian. editor. Nogales, Aurora. editor. Garcia-Gutierrez, Mari Cruz. editor. Ezquerra, T.A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-95968-7
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41. 
Cover image for Powder Diffraction The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Powder Diffraction The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
Author 
Will, Georg. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27986-5
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42. 
Cover image for Introduction to the characterization of residual stress by neutron diffraction
Introduction to the characterization of residual stress by neutron diffraction
Author 
Hutchings, Michael T.
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43. 
Cover image for Fundamentals of Powder Diffraction and Structural Characterization of Materials
Fundamentals of Powder Diffraction and Structural Characterization of Materials
Author 
Pecharsky, Vitalij K. author. Zavalij, Peter Y. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b106242
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44. 
Cover image for Analysis of residual stress by diffraction using neutron and synchrotron radiation
Analysis of residual stress by diffraction using neutron and synchrotron radiation
Author 
Fitzpatrick, M. E. (Michael E.) Lodini, Alain.
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45. 
Cover image for Canonical problems in scattering and potential theory. Pt. 2, Acoustic and electromagnetic diffraction by canonical structures
Canonical problems in scattering and potential theory. Pt. 2, Acoustic and electromagnetic diffraction by canonical structures
Author 
Vinogradov, Sergey S. (Sergey Sergeyevich) Smith, P. D. (Paul Denis), 1955- Vinogradova, Elena D. (Elena Dmitrievna)
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46. 
Cover image for Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects
Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects
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Morniroli, Jean Paul.
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47. 
Cover image for Characterization of nanoencapsulated food ingredients
Characterization of nanoencapsulated food ingredients
Author 
Jafari, Seid Mahdi.
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XX(522406.1)
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ScienceDirect https://www.sciencedirect.com/science/book/9780128156674
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48. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Author 
Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
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ONLINE(342225.1)
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Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414
ebrary http://site.ebrary.com/id/10881255
John Wiley http://dx.doi.org/10.1002/9783527681075
MyiLibrary http://www.myilibrary.com?id=615339
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