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37. 
Cover image for Embedded Deep Learning Algorithms, Architectures and Circuits for Always-on Neural Network Processing
Embedded Deep Learning Algorithms, Architectures and Circuits for Always-on Neural Network Processing
Author 
Moons, Bert. author. Bankman, Daniel. author. Verhelst, Marian. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-99223-5
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38. 
Cover image for Sensors Proceedings of the Fourth National Conference on Sensors, February 21-23, 2018, Catania, Italy
Sensors Proceedings of the Fourth National Conference on Sensors, February 21-23, 2018, Catania, Italy
Author 
Andò, Bruno. editor. Baldini, Francesco. editor. Di Natale, Corrado. editor. Ferrari, Vittorio. editor. Marletta, Vincenzo. editor.
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https://doi.org/10.1007/978-3-030-04324-7
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39. 
Cover image for Printing of Graphene and Related 2D Materials Technology, Formulation and Applications
Printing of Graphene and Related 2D Materials Technology, Formulation and Applications
Author 
Ng, Leonard W. T. author. Hu, Guohua. author. Howe, Richard C. T. author. Zhu, Xiaoxi. author. Yang, Zongyin. author.
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https://doi.org/10.1007/978-3-319-91572-2
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40. 
Cover image for Design Automation for Differential MOS Current-Mode Logic Circuits
Design Automation for Differential MOS Current-Mode Logic Circuits
Author 
Badel, Stéphane. author. Baltaci, Can. author. Cevrero, Alessandro. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-91307-0
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41. 
Cover image for Fundamentals of Solid State Engineering
Fundamentals of Solid State Engineering
Author 
Razeghi, Manijeh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75708-7
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42. 
Cover image for Radio Frequency Cell Site Engineering Made Easy
Radio Frequency Cell Site Engineering Made Easy
Author 
Faruque, Saleh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99615-8
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43. 
Cover image for Artificial Intelligence in IoT
Artificial Intelligence in IoT
Author 
Al-Turjman, Fadi. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04110-6
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44. 
Cover image for Multi-run Memory Tests for Pattern Sensitive Faults
Multi-run Memory Tests for Pattern Sensitive Faults
Author 
Mrozek, Ireneusz. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-91204-2
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45. 
Cover image for Applications in Electronics Pervading Industry, Environment and Society APPLEPIES 2017
Applications in Electronics Pervading Industry, Environment and Society APPLEPIES 2017
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De Gloria, Alessandro. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-93082-4
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46. 
Cover image for Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Automated Broad and Narrow Band Impedance Matching for RF and Microwave Circuits
Author 
Banerjee, Amal. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-99001-9
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47. 
Cover image for Scheduling Parallel Applications on Heterogeneous Distributed Systems
Scheduling Parallel Applications on Heterogeneous Distributed Systems
Author 
Xie, Guoqi. author. Zeng, Gang. author. Li, Renfa. author. Li, Keqin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-6557-7
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48. 
Cover image for Radiation Effects on Integrated Circuits and Systems for Space Applications
Radiation Effects on Integrated Circuits and Systems for Space Applications
Author 
Velazco, Raoul. editor. McMorrow, Dale. editor. Estela, Jaime. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-04660-6
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