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49. 
Cover image for Software performance and scalability a quantitative approach
Software performance and scalability a quantitative approach
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Liu, Henry H. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470465394
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50. 
Cover image for Solid state polymerization
Solid state polymerization
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Papaspyrides, Constantine D. Vouyiouka, Stamatina N. Wiley InterScience (Online service)
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51. 
Cover image for Design and construction of coordination polymers
Design and construction of coordination polymers
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Hong, Mao-Chun. Chen, Ling, 1971-
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52. 
Cover image for Ultrafast optics
Ultrafast optics
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Weiner, Andrew Marc.
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53. 
Cover image for Statistical tolerance regions theory, applications, and computation
Statistical tolerance regions theory, applications, and computation
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Krishnamoorthy, K. (Kalimuthu) Mathew, Thomas, 1955-
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54. 
Cover image for Advances in sintering science and technology a collection of papers presented at the International Conference on Sintering, November 16-20, 2009 [i.e. 2008], La Jolla, California
Advances in sintering science and technology a collection of papers presented at the International Conference on Sintering, November 16-20, 2009 [i.e. 2008], La Jolla, California
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International Conference on Sintering (2008 : La Jolla, San Diego, Calif.) Bordia, Rajendra K. Olevsky, Eugene A. Wiley InterScience (Online service)
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55. 
Cover image for Visual perception through video imagery
Visual perception through video imagery
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Dhome, Michel. Wiley InterScience (Online service)
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56. 
Cover image for Spoken language processing
Spoken language processing
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Mariani, Joseph.
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57. 
Cover image for Optimization in signal and image processing
Optimization in signal and image processing
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Siarry, Patrick. Wiley InterScience (Online service)
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58. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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59. 
Cover image for Solid-state physics for electronics
Solid-state physics for electronics
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Moliton, André. Wiley InterScience (Online service)
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60. 
Cover image for Power electronics semiconductor devices
Power electronics semiconductor devices
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Perret, Robert (Robert Jos)
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