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49. 
Cover image for ICT with Intelligent Applications ICTIS 2023, Volume 1
ICT with Intelligent Applications ICTIS 2023, Volume 1
Author 
Choudrie, Jyoti. editor. Mahalle, Parikshit N. editor. Perumal, Thinagaran. editor. Joshi, Amit. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-3758-5
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50. 
Cover image for ICT Infrastructure and Computing Proceedings of ICT4SD 2023, Volume 3
ICT Infrastructure and Computing Proceedings of ICT4SD 2023, Volume 3
Author 
Tuba, Milan. editor. Akashe, Shyam. editor. Joshi, Amit. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-4932-8
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51. 
Cover image for Secure Automatic Dependent Surveillance-Broadcast Systems
Secure Automatic Dependent Surveillance-Broadcast Systems
Author 
Yang, Haomiao. author. Li, Hongwei. author. Shen, Xuemin Sherman. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-07021-1
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52. 
Cover image for Advances in System-Integrated Intelligence Proceedings of the 6th International Conference on System-Integrated Intelligence (SysInt 2022), September 7-9, 2022, Genova, Italy
Advances in System-Integrated Intelligence Proceedings of the 6th International Conference on System-Integrated Intelligence (SysInt 2022), September 7-9, 2022, Genova, Italy
Author 
Valle, Maurizio. editor. Lehmhus, Dirk. editor. Gianoglio, Christian. editor. Ragusa, Edoardo. editor. Seminara, Lucia. editor.
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https://doi.org/10.1007/978-3-031-16281-7
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53. 
Cover image for Distributed Fault-Tolerant Consensus Control of Leader-Following Systems Based on Adaptive Control Approach
Distributed Fault-Tolerant Consensus Control of Leader-Following Systems Based on Adaptive Control Approach
Author 
Shen, Qikun. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-7426-9
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54. 
Cover image for Key Technologies of Internet of Things and Smart Grid
Key Technologies of Internet of Things and Smart Grid
Author 
Zeng, Xianwu. author. Bao, Shuping. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-7603-4
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55. 
Cover image for ICT Analysis and Applications Proceedings of ICT4SD 2023, Volume 2
ICT Analysis and Applications Proceedings of ICT4SD 2023, Volume 2
Author 
Fong, Simon. editor. Dey, Nilanjan. editor. Joshi, Amit. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-6568-7
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56. 
Cover image for Enterprise Interoperability IX Interoperability in the Era of Artificial Intelligence
Enterprise Interoperability IX Interoperability in the Era of Artificial Intelligence
Author 
Archimède, Bernard. editor. Ducq, Yves. editor. Young, Bob. editor. Karray, Hedi. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-90387-9
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57. 
Cover image for Proceedings of the Second International Conference on Innovations in Computing Research (ICR'23)
Proceedings of the Second International Conference on Innovations in Computing Research (ICR'23)
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Daimi, Kevin. editor. Al Sadoon, Abeer. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-35308-6
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58. 
Cover image for IoT, Big Data and AI for Improving Quality of Everyday Life: Present and Future Challenges IOT, Data Science and Artificial Intelligence Technologies
IoT, Big Data and AI for Improving Quality of Everyday Life: Present and Future Challenges IOT, Data Science and Artificial Intelligence Technologies
Author 
Singh, Pradeep Kumar. editor. Wierzchoń, Sławomir T. editor. Pawłowski, Wiesław. editor. Kar, Arpan Kumar. editor. Kumar, Yugal. editor.
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https://doi.org/10.1007/978-3-031-35783-1
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59. 
Cover image for ITNG 2023 20th International Conference on Information Technology-New Generations
ITNG 2023 20th International Conference on Information Technology-New Generations
Author 
Latifi, Shahram. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-28332-1
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60. 
Cover image for Advances in Technical Diagnostics II Proceedings of the 7th International Congress on Technical Diagnostics, ICTD 2022, 14-16 September 2022, Radom, Poland
Advances in Technical Diagnostics II Proceedings of the 7th International Congress on Technical Diagnostics, ICTD 2022, 14-16 September 2022, Radom, Poland
Author 
Puchalski, Andrzej. editor. Łazarz, Bogusław Edward. editor. Chaari, Fakher. editor. Komorska, Iwona. editor. Zimroz, Radoslaw. editor.
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https://doi.org/10.1007/978-3-031-31719-4
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