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49. 
Cover image for Alternative methods of regression
Alternative methods of regression
Author 
Birkes, David. Dodge, Yadolah, 1944- Wiley InterScience (Online service)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818791
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley041/92031165.html
http://site.ebrary.com/lib/alltitles/Doc?id=10504196
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50. 
Cover image for Variance components
Variance components
Author 
Searle, S. R. (Shayle R.), 1928- Casella, George. McCulloch, Charles E.
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=468694
John Wiley http://dx.doi.org/10.1002/9780470316856
http://onlinelibrary.wiley.com/book/10.1002/9780470316856
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/23902113.html
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51. 
Cover image for Discriminant analysis and statistical pattern recognition
Discriminant analysis and statistical pattern recognition
Author 
McLachlan, Geoffrey J., 1946-
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John Wiley http://dx.doi.org/10.1002/0471725293
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/24247203.html
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52. 
Cover image for A user's guide to principal components
A user's guide to principal components
Author 
Jackson, J. Edward. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471725331
ebrary http://site.ebrary.com/id/10275067
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53. 
Cover image for Fundamentals of exploratory analysis of variance
Fundamentals of exploratory analysis of variance
Author 
Hoaglin, David C. (David Caster), 1944- Mosteller, Frederick, 1916-2006. Tukey, John W. (John Wilder), 1915-2000. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470316832
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54. 
Cover image for Forecasting with dynamic regression models
Forecasting with dynamic regression models
Author 
Pankratz, Alan, 1944- Wiley InterScience (Online service)
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55. 
Cover image for Accelerated testing statistical models, test plans and data analyses
Accelerated testing statistical models, test plans and data analyses
Author 
Nelson, Wayne, 1936-
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John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
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56. 
Cover image for Finding groups in data an introduction to cluster analysis
Finding groups in data an introduction to cluster analysis
Author 
Kaufman, Leonard. Rousseeuw, Peter J. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470316801
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57. 
Cover image for Statistical methods in engineering and quality assurance
Statistical methods in engineering and quality assurance
Author 
John, Peter William Meredith.
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HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/21329921.html
John Wiley http://dx.doi.org/10.1002/9780470316825
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58. 
Cover image for Robust estimation and testing
Robust estimation and testing
Author 
Staudte, Robert G. Sheather, Simon J. Wiley InterScience (Online service)
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59. 
Cover image for Nonlinear regression analysis and its applications
Nonlinear regression analysis and its applications
Author 
Bates, Douglas M. Watts, Donald G.
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John Wiley http://dx.doi.org/10.1002/9780470316757
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60. 
Cover image for Sensitivity analysis in linear regression
Sensitivity analysis in linear regression
Author 
Chatterjee, Samprit, 1938- Hadi, Ali S. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470316764
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