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49. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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50. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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51. 
Cover image for Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Author 
Popovich, Mikhhail. author. Mezhiba, Andrey V. author. Friedman, Eby G. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71601-5
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52. 
Cover image for Rapid Prototyping of Digital Systems
Rapid Prototyping of Digital Systems
Author 
Hamblen, James O. author. Hall, Tyson S. author. Furman, Michael D. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-72671-7
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53. 
Cover image for Adaptive Techniques for Dynamic Processor Optimization Theory and Practice
Adaptive Techniques for Dynamic Processor Optimization Theory and Practice
Author 
Wang, Alice. editor. Naffziger, Samuel. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76472-6
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54. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76474-0
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55. 
Cover image for CMOS Active Inductors and Transformers Principle, Implementation, and Applications
CMOS Active Inductors and Transformers Principle, Implementation, and Applications
Author 
Yuan, Fei. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76479-5
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56. 
Cover image for System Verilog for Verification A Guide to Learning the Testbench Language Features
System Verilog for Verification A Guide to Learning the Testbench Language Features
Author 
Spear, Chris. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76530-3
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57. 
Cover image for RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
RF Imperfections in High-rate Wireless Systems Impact and Digital Compensation
Author 
Schenk, Tim. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6903-1
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58. 
Cover image for Handbuch für die Pogrammierung mit LabVIEW mit Studentenversion LabVIEW 8
Handbuch für die Pogrammierung mit LabVIEW mit Studentenversion LabVIEW 8
Author 
Mütterlein, Bernward. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-8274-2338-2
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59. 
Cover image for Modern Circuit Placement Best Practices and Results
Modern Circuit Placement Best Practices and Results
Author 
Nam, Gi-Joon. editor. Cong, Jason. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68739-1
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60. 
Cover image for Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Author 
Chinnery, David. author. Keutzer, Kurt. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68953-1
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