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49. 
Cover image for Modern Ferrite Technology
Modern Ferrite Technology
Author 
Goldman, Alex. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-29413-1
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50. 
Cover image for Beam Instrumentation and Diagnostics
Beam Instrumentation and Diagnostics
Author 
Strehl, Peter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-26404-3
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51. 
Cover image for Matching Properties of Deep Sub-Micron MOS Transistors
Matching Properties of Deep Sub-Micron MOS Transistors
Author 
Croon, Jeroen A. author. Sansen, Willy. author. Maes, Herman E. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b105122
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52. 
Cover image for Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications
Ferroelectric Thin Films Basic Properties and Device Physics for Memory Applications
Author 
Okuyama, Masanori. editor. Ishibashi, Yoshihiro. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b99517
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53. 
Cover image for Intense Electron and Ion Beams
Intense Electron and Ion Beams
Author 
Molokovsky, Sergey Ivanovich. author. Sushkov, Aleksandr Danilovich. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28812-0
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