Limit Search Results
Author
SpringerLink (Online service)
(254)
Khatri, Sunil P. author.
(4)
Wang, Lihui. editor.
(4)
Bertacco, Valeria. author.
(3)
Leblebici, Yusuf. author.
(3)
Language
Publication Date
-
Subject
Computer aided design.
(253)
Systems engineering.
(139)
Engineering design.
(51)
Electronics.
(25)
Industrial engineering.
(25)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
256 Results Found Subscribe to search results
000000000000DEFAULT
Print
49. 
Cover image for Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author 
Shen, Ruijing. author. Tan, Sheldon X.-D. author. Yu, Hao. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0788-1
Format: 
Availability 
Online Library~1
Available:
Copies:
50. 
Cover image for Reliability, Availability and Serviceability of Networks-on-Chip
Reliability, Availability and Serviceability of Networks-on-Chip
Author 
Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0791-1
Format: 
Availability 
Online Library~1
Available:
Copies:
51. 
Cover image for Error Control for Network-on-Chip Links
Error Control for Network-on-Chip Links
Author 
Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9313-7
Format: 
Availability 
Online Library~1
Available:
Copies:
52. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-543-9
Format: 
Availability 
Online Library~1
Available:
Copies:
53. 
Cover image for Design of Image Processing Embedded Systems Using Multidimensional Data Flow
Design of Image Processing Embedded Systems Using Multidimensional Data Flow
Author 
Keinert, Joachim. author. Teich, Jürgen. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7182-1
Format: 
Availability 
Online Library~1
Available:
Copies:
54. 
Cover image for Ultra-thin Chip Technology and Applications
Ultra-thin Chip Technology and Applications
Author 
Burghartz, Joachim. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7276-7
Format: 
Availability 
Online Library~1
Available:
Copies:
55. 
Cover image for Post-Silicon and Runtime Verification for Modern Processors
Post-Silicon and Runtime Verification for Modern Processors
Author 
Wagner, Ilya. author. Bertacco, Valeria. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8034-2
Format: 
Availability 
Online Library~1
Available:
Copies:
56. 
Cover image for Digitally-Assisted Analog and RF CMOS Circuit Design for Software-Defined Radio
Digitally-Assisted Analog and RF CMOS Circuit Design for Software-Defined Radio
Author 
Okada, Kenichi. editor. Kousai, Shouhei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8514-9
Format: 
Availability 
Online Library~1
Available:
Copies:
57. 
Cover image for Programming Many-Core Chips
Programming Many-Core Chips
Author 
Vajda, András. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9739-5
Format: 
Availability 
Online Library~1
Available:
Copies:
58. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2167-1
Format: 
Availability 
Online Library~1
Available:
Copies:
59. 
Cover image for Rapid One-of-a-kind Product Development Strategies, Algorithms and Tools
Rapid One-of-a-kind Product Development Strategies, Algorithms and Tools
Author 
Xie, Shane (S.Q.). author. Tu, Yiliu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84996-341-1
Format: 
Availability 
Online Library~1
Available:
Copies:
60. 
Cover image for Regular Nanofabrics in Emerging Technologies Design and Fabrication Methods for Nanoscale Digital Circuits
Regular Nanofabrics in Emerging Technologies Design and Fabrication Methods for Nanoscale Digital Circuits
Author 
Ben Jamaa, M. Haykel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-0650-7
Format: 
Availability 
Online Library~1
Available:
Copies:
Select an Action