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SpringerLink (Online service)

(19)

Collège français de métrologie.

(2)

Gåsvik, Kjell J.

(2)

John Wiley & Sons.

(2)

(2)

Mills, David L.

(2)

Osten, Wolfgang. editor.

(2)

Whitehouse, D. J. (David J.)

(2)

Whitehouse, D. J. (David J.). Handbook of surface metrology.

(2)

Wiley InterScience (Online service)

(2)

Abran, Alain, 1949-

(1)

(1)

Bandyopadhyay, Sanghamitra. editor.

(1)

Berglund, Birgitta.

(1)

Boutier, A. (Alain)

(1)

Bowen, D. Keith (David Keith), 1940-

(1)

Brown, Christopher A. editor.

(1)

Brown, Robert. author.

(1)

Callegaro, Luca.

(1)

Cardoso, Jaime S. editor.

(1)

Ciaccio, Marcello. editor.

(1)

Czichos, Horst. editor.

(1)

Diebold, A. C. (Alain C.)

(1)

Diering, Magdalena. editor.

(1)

Donnerhacke, Karl-Heinz.

(1)

Emery, A. F. (Ashley Francis), 1934- author.

(1)

Engen, Glenn F.

(1)

(1)

Forbes, Alistair B. editor.

(1)

Franceschini, Fiorenzo. author.

(1)

Fujita, Daisuke, editor.

(1)

Galetto, Maurizio. author.

(1)

Galyer, J. F. W.

(1)

Gao, Wei. editor.

(1)

Gläser, Michael, 1942-

(1)

Gupta, S. V. author.

(1)

Harding, Kevin G.

(1)

Hebra, Alexius J. author.

(1)

Hocken, Robert J.

(1)

Horn, Alexander, PD Dr.

(1)

International Metrology Conference (13th : 2007 : French College of Metrology)

(1)

Kaiser, Debra L., editor.

(1)

Kaschke, Michael F.

(1)

Kaufmann, Guillermo H.

(1)

Kes, P. H. (Peter H.)

(1)

Kochsiek, Manfred.

(1)

Kramer, Thomas R. author.

(1)

Kryszkiewicz, Marzena. editor.

(1)

Kujawinska, Malgorzata. editor.

(1)

(1)

Liu, Zheng. editor.

(1)

Maisano, Domenico. author.

(1)

Mansfield, Elisabeth, editor.

(1)

Mark, William D.

(1)

Mastrogiacomo, Luca. author.

(1)

Meinrath, G. author.

(1)

Muralikrishnan, Bala. author.

(1)

Niel, Kurt. editor.

(1)

Osten, Wolfgang.

(1)

(1)

Padilla, J. Moisés (José Moisés), author.

(1)

Pal, Sankar K. editor.

(1)

Pardo, Xosé M. editor.

(1)

Paredes, Roberto. editor.

(1)

Pavese, Franco. editor.

(1)

Pereira, Paulo H.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. editor.

(1)

Quinten, Michael.

(1)

Quiroga, J. Antonio (Juan Antonio), author.

(1)

Raja, Jay. author.

(1)

Ramuhalli, Pradeep. editor.

(1)

Raza, Hassan. editor.

(1)

Reingand, Nadya.

(1)

Rill, Michael Stefan.

(1)

Rogalla, H. (Horst)

(1)

Rybinski, Henryk. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schaeffer, Ronald D.

(1)

Schneider, Petra. author.

(1)

Servín, Manuel, author.

(1)

Shotbolt, C. R., ort. yaz.

(1)

Silvani, Xavier. author.

(1)

Smith, Leslie. editor.

(1)

(1)

Tanner, B. K. (Brian Keith)

(1)

Tuchin, V. V. (Valeri? Viktorovich)

(1)

Ukida, Hiroyuki. editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Vosk, Ted, author.

(1)

Wieczorowski, Michał. editor.

(1)

Wong, Terence K. S.

(1)

Xu, Xun. author.

(1)

Yoshizawa, T?ru, 1939-

(1)

Zhao, Yaoyao (Fiona). author.

(1)

Language

(58)

(1)

Publication Date

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(11)

(8)

(7)

(6)

(5)

(4)

(3)

(3)

(2)

(2)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

(8)

(8)

Electronic books.

(7)

Nanotechnology.

(5)

Optical measurements.

(4)

(4)

Surfaces (Physics).

(4)

Computer aided design.

(3)

(3)

Computer vision.

(2)

Hydraulic engineering.

(2)

(2)

(2)

Microtechnology.

(2)

Optical measurements -- Handbooks, manuals, etc.

(2)

Physical measurements.

(2)

Quality control.

(2)

Speckle metrology.

(2)

Surfaces (Technology) -- Measurement.

(2)

(2)

Analytical biochemistry.

(1)

Ağırlıklar ve ölçüler -- Türkiye

(1)

COMPUTERS -- Software Development & Engineering -- Quality Assurance & Testing.

(1)

Chemical engineering.

(1)

(1)

(1)

Compound semiconductors -- Design and construction -- Materials.

(1)

Compound semiconductors.

(1)

Computer networks -- Management.

(1)

Computer networks.

(1)

Computer science -- Mathematics.

(1)

Control engineering systems.

(1)

Coordinate measuring machines.

(1)

Corrosion and anti-corrosives.

(1)

Diffraction patterns.

(1)

Dimensional analysis -- Handbooks, manuals, etc.

(1)

Dimensional analysis.

(1)

Distribution (Probability theory).

(1)

Electric network analyzers.

(1)

(1)

(1)

Engineering Fluid Dynamics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Engineering design.

(1)

Engineering mathematics.

(1)

Environmental toxicology.

(1)

(1)

Fluid mechanics -- Measurement.

(1)

(1)

Forensic sciences.

(1)

Gamma ray detectors -- Materials.

(1)

Gearing -- Vibration -- Mathematical models.

(1)

Gearing -- Vibration -- Measurement.

(1)

(1)

Holographic testing.

(1)

Human information processing -- Mathematical models.

(1)

Image processing.

(1)

Imaging systems in medicine -- Handbooks, manuals, etc.

(1)

Imaging systems.

(1)

Industrial engineering.

(1)

Industrial safety.

(1)

Integrated circuits -- Measurement.

(1)

Interferometry.

(1)

(1)

Lasers -- Industrial applications.

(1)

(1)

Mass (Physics) -- Measurement.

(1)

Mathematical statistics.

(1)

(1)

(1)

Measurement -- Congresses.

(1)

Measurement -- Handbooks, manuals, etc.

(1)

Measurement Science and Instrumentation.

(1)

(1)

Mechanical engineering.

(1)

Mechanics, applied.

(1)

(1)

(1)

Metrology -- Handbooks, manuals, etc.

(1)

(1)

Microelectromechanical systems -- Measurement.

(1)

Microelectronics -- Measurement.

(1)

Microwave circuits.

(1)

Microwave measurements.

(1)

Motor vehicles -- Transmission devices.

(1)

Motor vehicles -- Vibration -- Measurement.

(1)

Nanophotonics -- Handbooks, manuals, etc.

(1)

(1)

Nanotechnologie.

(1)

Network Time Protocol (Computer network protocol)

(1)

(1)

Oceanographic instruments.

(1)

Oceanography -- Measurement.

(1)

Ophthalmology -- Equipment and supplies.

(1)

Optical data processing.

(1)

Optometry -- Equipment and supplies.

(1)

Parameter estimation.

(1)

Perception -- Mathematical models.

(1)

Photobiology -- Handbooks, manuals, etc.

(1)

Photonics -- Handbooks, manuals, etc.

(1)

(1)

Phototherapy -- Handbooks, manuals, etc.

(1)

Physical measurements

(1)

(1)

(1)

Semiconductor wafers -- Inspection.

(1)

Semiconductors -- Design and construction -- Materials.

(1)

Semiconductors -- Design and construction -- Quality control.

(1)

Semiconductors -- Inspection.

(1)

Semiconductors -- Measurement.

(1)

Senses and sensation -- Mathematical models.

(1)

Signal processing.

(1)

Silicon-on-insulator technology.

(1)

Software measurement -- Design -- Case studies.

(1)

Software measurement -- Design.

(1)

Speckle-Interferometrie.

(1)

Speckle-Metrologie.

(1)

Speckle-Metrology.

(1)

Speech processing systems.

(1)

(1)

Structural control (Engineering).

(1)

Superconductors -- Industrial applications.

(1)

Superconductors -- Research -- History.

(1)

Synchronization.

(1)

Synchronous data transmission systems.

(1)

Thin films -- Optical properties.

(1)

(1)

Three-dimensional imaging.

(1)

Timing circuits -- Design and construction.

(1)

Waste disposal.

(1)

Weights and measures -- Turkey

(1)

Weights and measures.

(1)

X-ray diffractometer -- Materials.

(1)

X-rays -- Diffraction.

(1)

X-rays -- Measurement -- Materials.

(1)

(1)

(1)

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49.

Cover image for Electrical impedance principles, measurement, and applications

Electrical impedance principles, measurement, and applications

Electrical impedance principles, measurement, and applications

Author

Callegaro, Luca.

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ONLINE

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50.

Cover image for Yasal metroloji

Yasal metroloji

Yasal metroloji

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QC89.T9 Y37 2013

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51.

Cover image for Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Measurements with persons theory, methods, and implementation areas

Author

Berglund, Birgitta.

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52.

Cover image for 100 years of superconductivity

100 years of superconductivity

100 years of superconductivity

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Rogalla, H. (Horst) Kes, P. H. (Peter H.)

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53.

Cover image for Fundamentals of laser micromachining

Fundamentals of laser micromachining

Fundamentals of laser micromachining

Author

Schaeffer, Ronald D.

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54.

Cover image for Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

Compound semiconductor radiation detectors

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Owens, Alan.

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55.

Cover image for Coordinate measuring machines and systems

Coordinate measuring machines and systems

Coordinate measuring machines and systems

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Hocken, Robert J. Pereira, Paulo H.

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56.

Cover image for Computer network time synchronization the Network Time Protocol on Earth and in space

Computer network time synchronization the Network Time Protocol on Earth and in space

Computer network time synchronization the Network Time Protocol on Earth and in space

Author

Mills, David L.

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57.

Cover image for Handbook of photonics for biomedical science

Handbook of photonics for biomedical science

Handbook of photonics for biomedical science

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Tuchin, V. V. (Valeri? Viktorovich)

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58.

Cover image for Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

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Leach, R. K.

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ScienceDirect http://www.sciencedirect.com/science/book/9780080964546

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59.

Cover image for Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

Fundamental principles of engineering nanometrology

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Leach, R. K.

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ONLINE(355774.1)

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60.

Cover image for Computer network time synchronization the network time protocol

Computer network time synchronization the network time protocol

Computer network time synchronization the network time protocol

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Mills, David L.

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