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49. 
Cover image for Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part I
Applications of Evolutionary Computation 20th European Conference, EvoApplications 2017, Amsterdam, The Netherlands, April 19-21, 2017, Proceedings, Part I
Author 
Squillero, Giovanni. editor. Sim, Kevin. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-55849-3
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50. 
Cover image for Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects
Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects
Author 
Lourenço, Nuno. author. Martins, Ricardo. author. (orcid)0000-0002-8251-1415 Horta, Nuno. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-42037-0
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51. 
Cover image for Formal Verification of Simulink/Stateflow Diagrams A Deductive Approach
Formal Verification of Simulink/Stateflow Diagrams A Deductive Approach
Author 
Zhan, Naijun. author. Wang, Shuling. author. (orcid)0000-0002-2798-2660 Zhao, Hengjun. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-47016-0
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52. 
Cover image for Designing with Xilinx® FPGAs Using Vivado
Designing with Xilinx® FPGAs Using Vivado
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Churiwala, Sanjay. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-42438-5
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53. 
Cover image for Fundamentals of Electronic Systems Design
Fundamentals of Electronic Systems Design
Author 
Lienig, Jens. author. (orcid)0000-0002-2140-4587 Bruemmer, Hans. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-55840-0
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54. 
Cover image for Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment
Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment
Author 
Sklavos, Nicolas. editor. Chaves, Ricardo. editor. Di Natale, Giorgio. editor. Regazzoni, Francesco. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-44318-8
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55. 
Cover image for Testing of Interposer-Based 2.5D Integrated Circuits
Testing of Interposer-Based 2.5D Integrated Circuits
Author 
Wang, Ran. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-54714-5
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56. 
Cover image for Parallel Architecture, Algorithm and Programming 8th International Symposium, PAAP 2017, Haikou, China, June 17-18, 2017, Proceedings
Parallel Architecture, Algorithm and Programming 8th International Symposium, PAAP 2017, Haikou, China, June 17-18, 2017, Proceedings
Author 
Chen, Guoliang. editor. Shen, Hong. editor. Chen, Mingrui. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-6442-5
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57. 
Cover image for From Variability Tolerance to Approximate Computing in Parallel Integrated Architectures and Accelerators
From Variability Tolerance to Approximate Computing in Parallel Integrated Architectures and Accelerators
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Rahimi, Abbas. author. Benini, Luca. author. Gupta, Rajesh K. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-53768-9
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58. 
Cover image for Embedded Systems Design with Special Arithmetic and Number Systems
Embedded Systems Design with Special Arithmetic and Number Systems
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Molahosseini, Amir Sabbagh. editor. de Sousa, Leonel Seabra. editor. (orcid)0000-0002-8066-221X Chang, Chip-Hong. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-49742-6
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59. 
Cover image for Green IT Engineering: Concepts, Models, Complex Systems Architectures
Green IT Engineering: Concepts, Models, Complex Systems Architectures
Author 
Kharchenko, Vyacheslav. editor. Kondratenko, Yuriy. editor. Kacprzyk, Janusz. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-44162-7
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60. 
Cover image for The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Era
The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Era
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Rahmani, Amir M. editor. Liljeberg, Pasi. editor. Hemani, Ahmed. editor. Jantsch, Axel. editor. Tenhunen, Hannu. editor.
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https://doi.org/10.1007/978-3-319-31596-6
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