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49. 
Cover image for Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers
Hardware and Software, Verification and Testing First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers
Author 
Ur, Shmuel. editor. Bin, Eyal. editor. Wolfsthal, Yaron. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11678779
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50. 
Cover image for Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings
Testing of Communicating Systems 18th IFIP TC 6/WG 6.1 International Conference, TestCom 2006, New York, NY, USA, May 16-18, 2006. Proceedings
Author 
Uyar, M. Ümit. editor. Duale, Ali Y. editor. Fecko, Mariusz A. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11754008
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51. 
Cover image for Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers
Formal Approaches to Software Testing 5th International Workshop, FATES 2005, Edinburgh, UK, July 11, 2005, Revised Selected Papers
Author 
Grieskamp, Wolfgang. editor. Weise, Carsten. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11759744
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52. 
Cover image for Theory and Applications of Satisfiability Testing - SAT 2006 9th International Conference, Seattle, WA, USA, August 12-15, 2006. Proceedings
Theory and Applications of Satisfiability Testing - SAT 2006 9th International Conference, Seattle, WA, USA, August 12-15, 2006. Proceedings
Author 
Biere, Armin. editor. Gomes, Carla P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11814948
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53. 
Cover image for Testing Commercial-off-the-Shelf Components and Systems
Testing Commercial-off-the-Shelf Components and Systems
Author 
Beydeda, Sami. editor. Gruhn, Volker. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138567
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54. 
Cover image for Theory and Applications of Satisfiability Testing 8th International Conference, SAT 2005, St Andrews, UK, June 19-23, 2005. Proceedings
Theory and Applications of Satisfiability Testing 8th International Conference, SAT 2005, St Andrews, UK, June 19-23, 2005. Proceedings
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Bacchus, Fahiem. editor. Walsh, Toby. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137280
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55. 
Cover image for Formal Approaches to Software Testing 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers
Formal Approaches to Software Testing 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers
Author 
Grabowski, Jens. editor. Nielsen, Brian. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b106767
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56. 
Cover image for Theory and Applications of Satisfiability Testing 7th International Conference, SAT 2004, Vancouver, BC, Canada, May 10-13, 2004, Revised Selected Papers
Theory and Applications of Satisfiability Testing 7th International Conference, SAT 2004, Vancouver, BC, Canada, May 10-13, 2004, Revised Selected Papers
Author 
Hoos, Holger H. editor. Mitchell, David G. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11527695
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57. 
Cover image for Model-Based Testing of Reactive Systems Advanced Lectures
Model-Based Testing of Reactive Systems Advanced Lectures
Author 
Broy, Manfred. editor. Jonsson, Bengt. editor. Katoen, Joost-Pieter. editor. Leucker, Martin. editor. Pretschner, Alexander. editor.
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http://dx.doi.org/10.1007/b137241
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58. 
Cover image for Testing of Communicating Systems 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005, Montreal, Canada, May 31 - June, 2005. Proceedings
Testing of Communicating Systems 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005, Montreal, Canada, May 31 - June, 2005. Proceedings
Author 
Khendek, Ferhat. editor. Dssouli, Rachida. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b136676
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59. 
Cover image for Timing Performance of Nanometer Digital Circuits Under Process Variations
Timing Performance of Nanometer Digital Circuits Under Process Variations
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Champac, Victor. author. Garcia Gervacio, Jose. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-75465-9
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60. 
Cover image for Software and System Development using Virtual Platforms Full-System Simulation with Wind River Simics.
Software and System Development using Virtual Platforms Full-System Simulation with Wind River Simics.
Author 
Aarno, Daniel. Engblom, Jakob.
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ScienceDirect http://www.sciencedirect.com/science/book/9780128007259
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