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49. 
Cover image for Cryogenic Microelectronic Systems for Ultra-Low Energy and Enhanced Performance
Cryogenic Microelectronic Systems for Ultra-Low Energy and Enhanced Performance
Author 
Zhuldassov, Nurzhan. author. Friedman, Eby G. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-90754-8
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50. 
Cover image for Response Feature Technology for High-Frequency Electronics. Optimization, Modeling, and Design Automation
Response Feature Technology for High-Frequency Electronics. Optimization, Modeling, and Design Automation
Author 
Pietrenko-Dabrowska, Anna. author. Koziel, Slawomir. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-43845-5
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51. 
Cover image for Embedded Platforms for UAS Landing Path and Obstacle Detection II Navigation Support Systems for Urban Air Mobility Operations
Embedded Platforms for UAS Landing Path and Obstacle Detection II Navigation Support Systems for Urban Air Mobility Operations
Author 
Ariante, Gennaro. author. (orcid)0000-0002-7581-8224 Papa, Umberto. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59754-1
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52. 
Cover image for Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Silicon Components and Processes Self Study Rectifying and Ohmic Contacts, Bipolar Junction Transistors
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59189-1
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53. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
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54. 
Cover image for Advanced nanoscale MOSFET architectures : current trends and future perspectives
Advanced nanoscale MOSFET architectures : current trends and future perspectives
Author 
Biswas, Kalyan, editor. Sarkar, Angsuman, editor.
Preferred Shelf Number 
TK7871.95
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394188970
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55. 
Cover image for Integrated Electronic Circuits
Integrated Electronic Circuits
Author 
Atallah, Jad G. author. Ismail, Mohammed. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-62707-1
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56. 
Cover image for Emerging Radiation Detection Technology and Applications
Emerging Radiation Detection Technology and Applications
Author 
Iniewski, Kris. editor. Gadey, Harish. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-63897-8
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57. 
Cover image for Silicon Components and Processes Self Study Unit Processes and Process Integration
Silicon Components and Processes Self Study Unit Processes and Process Integration
Author 
El-Kareh, Badih. author. Hutter, Lou N. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-59219-5
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58. 
Cover image for Metal oxide semiconductors : synthesis, properties, and devices
Metal oxide semiconductors : synthesis, properties, and devices
Author 
Zang, Zhigang, author Cai, Wensi, author. Zhou, Yong, author.
Preferred Shelf Number 
TK7871.99 .M44
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527842551
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59. 
Cover image for Passive and Active Circuits by Example
Passive and Active Circuits by Example
Author 
Yuce, Erkan. author. Minaei, Shahram. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-44966-6
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60. 
Cover image for Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Proceedings of SIE 2023 54th Annual Meeting of the Italian Electronics Society
Author 
Ciofi, Carmine. editor. Limiti, Ernesto. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-48711-8
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