Limit Search Results
Author
SpringerLink (Online service)
(369)
Wiley InterScience (Online service)
(27)
Dhillon, B. S. (Balbir S.), 1947-
(9)
John Wiley & Sons.
(8)
Nakagawa, Toshio. author.
(6)
Language
Publication Date
-
Subject
System safety.
(148)
Engineering.
(136)
Reliability (Engineering)
(82)
Reliability.
(75)
Industrial safety.
(64)
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
729 Results Found Subscribe to search results
000000000000DEFAULT
Print
61. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
Format: 
Availability 
Online Library~1
Available:
Copies:
62. 
Cover image for Computer system reliability safety and usability
Computer system reliability safety and usability
Author 
Dhillon, B. S.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
63. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0463-7
Format: 
Availability 
Online Library~1
Available:
Copies:
64. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
Format: 
Availability 
Online Library~1
Available:
Copies:
65. 
Cover image for Reliability and availability of cloud computing
Reliability and availability of cloud computing
Author 
Bauer, Eric. Adams, Randee. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266788
Format: 
Availability 
Online Library~1
Available:
Copies:
66. 
Cover image for Reliability and maintenance networks and systems
Reliability and maintenance networks and systems
Author 
Beichelt, Frank, 1942- Tittmann, Peter.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
67. 
Cover image for Semiconductor packaging materials interaction and reliability
Semiconductor packaging materials interaction and reliability
Author 
Chen, Andrea. Lo, Randy.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
68. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
Format: 
Availability 
Online Library~1
Available:
Copies:
69. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-11125-9
Format: 
Availability 
Online Library~1
Available:
Copies:
70. 
Cover image for Functional Analysis Methods for Reliability Models
Functional Analysis Methods for Reliability Models
Author 
Gupur, Geni. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-0348-0101-0
Format: 
Availability 
Online Library~1
Available:
Copies:
71. 
Cover image for Multistate systems reliability theory with applications
Multistate systems reliability theory with applications
Author 
Natvig, Bent, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470977088
http://site.ebrary.com/lib/alltitles/Doc?id=10469650
Format: 
Availability 
Online Library~1
Available:
Copies:
72. 
Cover image for Transportation systems reliability and safety
Transportation systems reliability and safety
Author 
Dhillon, B. S. (Balbir S.), 1947-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
Select an Action