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Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Author 
Fränti, Pasi. editor. Brown, Gavin. editor. Loog, Marco. editor. Escolano, Francisco. editor. Pelillo, Marcello. editor. (orcid)0000-0001-8992-9243
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ONLINE
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https://doi.org/10.1007/978-3-662-44415-3
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Cover image for Pattern Recognition 6th Mexican Conference, MCPR 2014, Cancun, Mexico, June 25-28, 2014. Proceedings
Pattern Recognition 6th Mexican Conference, MCPR 2014, Cancun, Mexico, June 25-28, 2014. Proceedings
Author 
Martinez-Trinidad, Jose Francisco. editor. Carrasco-Ochoa, Jesús Ariel. editor. (orcid)0000-0002-9982-7758 Olvera-López, Jose Arturo. editor. Salas-Rodríguez, Joaquín. editor. Suen, Ching Y. editor.
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https://doi.org/10.1007/978-3-319-07491-7
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Cover image for Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 19th Iberoamerican Congress, CIARP 2014, Puerto Vallarta, Mexico, November 2-5, 2014, Proceedings
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications 19th Iberoamerican Congress, CIARP 2014, Puerto Vallarta, Mexico, November 2-5, 2014, Proceedings
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Bayro-Corrochano, Eduardo. editor. Hancock, Edwin. editor. (orcid)0000-0003-4496-2028 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-12568-8
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4. 
Cover image for STRUCTURAL PATTERN RECOGNITION USING GRAPH MATCHING approximate and error-tolerant... algorithms.
STRUCTURAL PATTERN RECOGNITION USING GRAPH MATCHING approximate and error-tolerant... algorithms.
Author 
DWIVEDI, SHRI PRAKASH.
Preferred Shelf Number 
TK7882 .P3
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003532248
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Landscape of next generation sequencing using pattern recognition : performance analysis and applications
Landscape of next generation sequencing using pattern recognition : performance analysis and applications
Author 
Mallik, Saurav, author. Gaur, Loveleen, author. Seth, Soumita, author. Bhadra, Tapas, author. Wang, Mingqiang, author.
Preferred Shelf Number 
RC78.7 .D53
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9788770042093
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for DEEP LEARNING FOR MULTIMEDIA PROCESSING APPLICATIONS. VOLUME TWO, Signal processing and pattern recognition
DEEP LEARNING FOR MULTIMEDIA PROCESSING APPLICATIONS. VOLUME TWO, Signal processing and pattern recognition
Author 
Bhatti, Uzair Aslam. Mengxing, Huang. Li, Jingbing. Bazai, Sibghat Ullah. Aamir, Muhammad.
Preferred Shelf Number 
QA76.575
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781032646268
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedings
Pattern Recognition and Image Analysis 11th Iberian Conference, IbPRIA 2023, Alicante, Spain, June 27-30, 2023, Proceedings
Author 
Pertusa, Antonio. editor. Gallego, Antonio Javier. editor. Sánchez, Joan Andreu. editor. Domingues, Inês. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-36616-1
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8. 
Cover image for Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part II
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part II
Author 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-37742-6
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9. 
Cover image for Pattern Recognition 15th Mexican Conference, MCPR 2023, Tepic, Mexico, June 21-24, 2023, Proceedings
Pattern Recognition 15th Mexican Conference, MCPR 2023, Tepic, Mexico, June 21-24, 2023, Proceedings
Author 
Rodríguez-González, Ansel Yoan. editor. Pérez-Espinosa, Humberto. editor. Martínez-Trinidad, José Francisco. editor. (orcid) Carrasco-Ochoa, Jesús Ariel. editor. Olvera-López, José Arturo. editor. (orcid)
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https://doi.org/10.1007/978-3-031-33783-3
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10. 
Cover image for Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part III
Pattern Recognition, Computer Vision, and Image Processing. ICPR 2022 International Workshops and Challenges Montreal, QC, Canada, August 21-25, 2022, Proceedings, Part III
Author 
Rousseau, Jean-Jacques. editor. (orcid) Kapralos, Bill. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-031-37731-0
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11. 
Cover image for Graph-Based Representations in Pattern Recognition 13th IAPR-TC-15 International Workshop, GbRPR 2023, Vietri sul Mare, Italy, September 6-8, 2023, Proceedings
Graph-Based Representations in Pattern Recognition 13th IAPR-TC-15 International Workshop, GbRPR 2023, Vietri sul Mare, Italy, September 6-8, 2023, Proceedings
Author 
Vento, Mario. editor. Foggia, Pasquale. editor. Conte, Donatello. editor. Carletti, Vincenzo. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-42795-4
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12. 
Cover image for Pattern Recognition 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I
Pattern Recognition 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I
Author 
Lu, Huimin. editor. Blumenstein, Michael. editor. Cho, Sung-Bae. editor. Liu, Cheng-Lin. editor. Yagi, Yasushi. editor.
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https://doi.org/10.1007/978-3-031-47634-1
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