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Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Author 
Bai, Xiao. editor. Hancock, Edwin R. editor. Ho, Tin Kam. editor. Wilson, Richard C. editor. Biggio, Battista. editor.
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https://doi.org/10.1007/978-3-319-97785-0
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Cover image for Data Complexity in Pattern Recognition
Data Complexity in Pattern Recognition
Author 
Basu, Mitra. editor. Ho, Tin Kam. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84628-172-3
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