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97. 
Cover image for Verification and validation for quality of UML 2.0 models
Verification and validation for quality of UML 2.0 models
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Unhelkar, Bhuvan. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/0471734322
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98. 
Cover image for Distributed data management for grid computing
Distributed data management for grid computing
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Di Stefano, Michael, 1963- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471738220
MyiLibrary, Table of contents http://www.myilibrary.com?id=27752&ref=toc
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99. 
Cover image for OFDM-based broadband wireless networks design and optimization
OFDM-based broadband wireless networks design and optimization
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Liu, Hui, 1968- Li, Guoqing, 1974- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471757195
http://www3.interscience.wiley.com/cgi-bin/bookhome/110527726
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100. 
Cover image for Fourier analysis
Fourier analysis
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Stade, Eric, 1961-
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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101. 
Cover image for Constrained statistical inference inequality, order, and shape restrictions
Constrained statistical inference inequality, order, and shape restrictions
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Silvapulle, Mervyn J., 1951- Sen, Pranab Kumar, 1937- Wiley InterScience (Online service)
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102. 
Cover image for Essentials of business process outsourcing
Essentials of business process outsourcing
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Duening, Thomas N. Click, Rick L.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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103. 
Cover image for Characterization and modeling to control sintered ceramic microstructures and properties proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
Characterization and modeling to control sintered ceramic microstructures and properties proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004)
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DiAntonio, C. B. American Ceramic Society. Meeting (106th : 2004 : Indianapolis, Ind.) Wiley InterScience (Online service) Characterization and Modeling to Control Sintered Ceramic Microstructure and Properties Symposium (2004 : Indianapolis, Ind.)
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104. 
Cover image for Ceramic nanomaterials and nanotechnology III proceedings of the 106th Annual Meeting of The American Ceramic Society : Indianapolis, indiana, USA (2004)
Ceramic nanomaterials and nanotechnology III proceedings of the 106th Annual Meeting of The American Ceramic Society : Indianapolis, indiana, USA (2004)
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Lu, Song Wei. Hu, Michael Z.-C. Gogot͡si, I͡U. G., 1961- Wiley InterScience (Online service) Nanostructured Materials and Nanotechnology Symposium (2004 : Indianapolis, Ind.)
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105. 
Cover image for Theoretical optics an introduction
Theoretical optics an introduction
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Römer, H. (Hartmann)
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John Wiley http://dx.doi.org/10.1002/3527604294
John Wiley http://dx.doi.org/10.1002/9783527604296
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106. 
Cover image for Magnetism molecules to materials. V
Magnetism molecules to materials. V
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Miller, Joel S. Drillon, Marc.
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107. 
Cover image for Quantum information processing
Quantum information processing
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Beth, Thomas, 1949- Leuchs, Gerd.
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108. 
Cover image for Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer range
Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer range
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Wilkening, Günter. Koenders, Ludger. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/3527606661
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