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1. 
Cover image for Reliability and failure of electronic materials and devices
Reliability and failure of electronic materials and devices
Author 
Ohring, Milton, 1936- Kasprzak, Lucian.
Preferred Shelf Number 
ONLINE(355485.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780120885749
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2. 
Cover image for Extreme environment electronics
Extreme environment electronics
Author 
Cressler, John D. Mantooth, H. Alan, 1963-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Reliability technology principles and practice of failure prevention in electronic systems
Reliability technology principles and practice of failure prevention in electronic systems
Author 
Pascoe, Norman.
Preferred Shelf Number 
ONLINE
Electronic Access 
Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9780470980101
http://onlinelibrary.wiley.com/book/10.1002/9780470980101
Books24x7 http://www.books24x7.com/marc.asp?bookid=41740
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4. 
Cover image for Failure analysis a practical guide for manufacturers of electronic components and systems
Failure analysis a practical guide for manufacturers of electronic components and systems
Author 
Bâzu, M. I. (Marius I.), 1948- Băjenescu, Titu I., 1938-
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119990093
Books24x7 http://www.books24x7.com/marc.asp?bookid=41699
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5. 
Cover image for Structural dynamics of electronic and photonic systems
Structural dynamics of electronic and photonic systems
Author 
Suhir, Ephraim. Yu, T. X. (Tongxi), 1941- Connally, Eric. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
$uhttp://onlinelibrary.wiley.com/book/10.1002/9780470950012
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6. 
Cover image for Parts selection and management
Parts selection and management
Author 
Pecht, Michael.
Preferred Shelf Number 
ONLINE
Electronic Access 
Authentication may be required
Full text available from Wiley InterScience
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/54046845.html
John Wiley http://dx.doi.org/10.1002/0471723886
Book review (E-STREAMS) http://www.e-streams.com/es0804/es0804_4027.html
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7. 
Cover image for Practical reliability of electronic equipment and products
Practical reliability of electronic equipment and products
Author 
Hnatek, Eugene R.
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ONLINE
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8. 
Cover image for Accelerated stress testing handbook guide for achieving quality products
Accelerated stress testing handbook guide for achieving quality products
Author 
Chan, H. Anthony, 1952- Englert, Paul J, 1960-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270476
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9. 
Cover image for Reliability and failure of electronic materials and devices
Reliability and failure of electronic materials and devices
Author 
Ohring, Milton, 1936-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125249850
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