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1. 
Cover image for Integrated passive component technology
Integrated passive component technology
Author 
Ulrich, Richard K. (Richard Kevin), 1955- Schaper, Leonard W.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5426840
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2. 
Cover image for Handbook of quality integrated circuit manufacturing
Handbook of quality integrated circuit manufacturing
Author 
Zorich, Robert.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127818702
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3. 
Cover image for Trace theory for automatic hierarchical verification of speed-independent circuits
Trace theory for automatic hierarchical verification of speed-independent circuits
Author 
Dill, David L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267249
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4. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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5. 
Cover image for VLSI handbook
VLSI handbook
Author 
Einspruch, Norman G.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122341007
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6. 
Cover image for Fine line lithography
Fine line lithography
Author 
Newman, Roger.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444853516
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