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1. 
Cover image for Optical inspection of microsystems
Optical inspection of microsystems
Author 
Osten, Wolfgang.
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2. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
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http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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3. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-36359-7
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4. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
Author 
Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-03051-2
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5. 
Cover image for Fringe 2005 The 5th International Workshop on Automatic Processing of Fringe Patterns
Fringe 2005 The 5th International Workshop on Automatic Processing of Fringe Patterns
Author 
Osten, Wolfgang. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29303-5
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