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1. 
Cover image for Signal recovery from noise in electronic instrumentation
Signal recovery from noise in electronic instrumentation
Author 
Wilmshurst, T. H., author. Taylor & Francis.
Preferred Shelf Number 
TK7878.4 .W55 1990
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781420050653
Taylor & Francis https://www.taylorfrancis.com/books/9780367806507
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Listening through the noise the aesthetics of experimental electronic music
Listening through the noise the aesthetics of experimental electronic music
Author 
Demers, Joanna Teresa, 1975-
Preferred Shelf Number 
ONLINE
Electronic Access 
Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780195387650.001.0001
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3. 
Cover image for Electronic Noise and Interfering Signals Principles and Applications
Electronic Noise and Interfering Signals Principles and Applications
Author 
Vasilescu, Gabriel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137720
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4. 
Cover image for Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
Author 
Sikula, Josef. editor. Levinshtein, Michael. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-2170-4
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5. 
Cover image for Electromagnetic compatibility engineering
Electromagnetic compatibility engineering
Author 
Ott, Henry W., 1936- Ott, Henry W., 1936- Noise reduction techniques in electronic systems.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=456206
John Wiley http://dx.doi.org/10.1002/9780470508510
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0913/2009006814-b.html
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6. 
Cover image for Artificial Neural Networks and Machine Learning - ICANN 2023 32nd International Conference on Artificial Neural Networks, Heraklion, Crete, Greece, September 26-29, 2023, Proceedings, Part VII
Artificial Neural Networks and Machine Learning - ICANN 2023 32nd International Conference on Artificial Neural Networks, Heraklion, Crete, Greece, September 26-29, 2023, Proceedings, Part VII
Author 
Iliadis, Lazaros. editor. (orcid) Papaleonidas, Antonios. editor. (orcid) Angelov, Plamen. editor. Jayne, Chrisina. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-44195-0
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7. 
Cover image for Principles and techniques of electromagnetic compatibility
Principles and techniques of electromagnetic compatibility
Author 
Christopoulos, Christos, author.
Preferred Shelf Number 
TK7867.5 .C47 2023 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/e/9781003310983
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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8. 
Cover image for Introduction to Instrumentation and Measurements
Introduction to Instrumentation and Measurements
Author 
Northrop, Robert B., author. Taylor and Francis.
Preferred Shelf Number 
 TK7870 .N66 2015
Electronic Access 
Click here to view.
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9. 
Cover image for Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
Author 
Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-19872-9
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10. 
Cover image for Strain-engineered MOSFETs
Strain-engineered MOSFETs
Author 
Maiti, C. K., author. Maiti, T. K.
Preferred Shelf Number 
TK7871.99 .M44 M248 2013
Electronic Access 
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11. 
Cover image for Single-atom nanoelectronics
Single-atom nanoelectronics
Author 
Prati, Enrico. Shinada, Takahiro.
Preferred Shelf Number 
TK7874.84 .S56 2013
Electronic Access 
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12. 
Cover image for Coaxial Electrical Circuits for Interference-Free Measurements
Coaxial Electrical Circuits for Interference-Free Measurements
Author 
Awan, Shakil Kibble, Bryan Schurr, J�rg
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL013E
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