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1. 
Cover image for Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
Author 
Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2470-2
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2. 
Cover image for Thermodynamics, Diffusion and the Kirkendall Effect in Solids
Thermodynamics, Diffusion and the Kirkendall Effect in Solids
Author 
Paul, Aloke. author. Laurila, Tomi. author. Vuorinen, Vesa. author. Divinski, Sergiy V. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-07461-0
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Online Library~1
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