Limit Search Results
Author
Language
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
8 Results Found Subscribe to search results
00000000DEFAULT
Print
1. 
Cover image for Quality control and applied statistics.
Quality control and applied statistics.
Author 
Executive Sciences Institute.
Preferred Shelf Number 
ALFABETİK V.17 1972
Format: 
Availability 
Beytepe Library~11 ~0
Available:
Copies:
2. 
Cover image for Quality control in analytical chemistry
Quality control in analytical chemistry
Author 
Kateman, G. Buydens, L., 1955-
Preferred Shelf Number 
QD75.4.Q34 K38 1993
Format: 
Availability 
Health Sciences Library~1
Available:
Copies:
3. 
Cover image for Quality control in the food industry
Quality control in the food industry
Author 
Herschdoerfer, S. M.
Preferred Shelf Number 
TP 370 H47 1967
Format: 
Availability 
Beytepe Library~2
Available:
Copies:
4. 
Cover image for Quality control in the pharmaceutical industry
Quality control in the pharmaceutical industry
Author 
Cooper, Murray S. ed.
Preferred Shelf Number 
QV 704 QUA 1972- V.1 1.K
Format: 
Availability 
Health Sciences Library~2
Available:
Copies:
5. 
Cover image for Molecular biology and pathology a guidebook for quality control
Molecular biology and pathology a guidebook for quality control
Author 
Farkas, Daniel H.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122491009
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Design and analysis of sensory optimization
Design and analysis of sensory optimization
Author 
Gacula, Maximo C. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470385012
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Türk-Alman Sempozyumu : Kalite Güvenliği ve Uluslararası Standartlar : Açılış konuşmaları, bildiriler, panel 22-23.11.1990, İstanbul = Türkish-Deutsches Symposium : Qualitatssicherung und Internationale Normen : Ansprachen, Vortrage, Podiumsdiskussion
Türk-Alman Sempozyumu : Kalite Güvenliği ve Uluslararası Standartlar : Açılış konuşmaları, bildiriler, panel 22-23.11.1990, İstanbul = Türkish-Deutsches Symposium : Qualitatssicherung und Internationale Normen : Ansprachen, Vortrage, Podiumsdiskussion
Author 
Kalite Güvenliği ve Uluslararası Standartlar Sempozyumu (1990 : İstanbul) Dinçmen, Murat, çev. Meyer, Ingo, çev. Coşkun, Özkan, çev. İTÜ İşletme Fakültesi Endüstri Mühendisliği Bölümü.
Preferred Shelf Number 
TS 156 K125 1990
Format: 
Availability 
Beytepe Library~1
Available:
Copies: