Switch to list view
Switch to thumbnail view
Select an Action
4 Results Found Subscribe to search results
0000DEFAULT
Print
1. 
Cover image for Post-Silicon Validation and Debug
Post-Silicon Validation and Debug
Author 
Mishra, Prabhat. editor. Farahmandi, Farimah. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-98116-1
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Silicon molecular beam epitaxy proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
Silicon molecular beam epitaxy proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
Author 
International Symposium on Silicon Molecular Beam Epitaxy (3rd : 1989 : Strasbourg, France) Kasper, Erich. Parker, E. H. C. European Materials Research Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444886200
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for CMOS-Compatible Key Engineering Devices for High-Speed Silicon-Based Optical Interconnections
CMOS-Compatible Key Engineering Devices for High-Speed Silicon-Based Optical Interconnections
Author 
Wang, Jing. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-3378-1
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Device Physics, Modeling, Technology, and Analysis for Silicon MESFET
Author 
Amiri, Iraj Sadegh. author. Mohammadi, Hossein. author. Hosseinghadiry, Mahdiar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-04513-5
Format: 
Availability 
Online Library~1
Available:
Copies: