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1. 
Cover image for Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
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Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-5269-0
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Cover image for VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
Author 
Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-3756-7
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Cover image for Image Analysis and Processing - ICIAP 2023 Workshops Udine, Italy, September 11-15, 2023, Proceedings, Part II
Image Analysis and Processing - ICIAP 2023 Workshops Udine, Italy, September 11-15, 2023, Proceedings, Part II
Author 
Foresti, Gian Luca. editor. Fusiello, Andrea. editor. Hancock, Edwin. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-51026-7
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4. 
Cover image for Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings
Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings
Author 
Gabmeyer, Sebastian. editor. Johnsen, Einar Broch. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-61467-0
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5. 
Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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6. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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