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1. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
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Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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Cover image for Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Second International Conference, RSSRail 2017, Pistoia, Italy, November 14-16, 2017, Proceedings
Reliability, Safety, and Security of Railway Systems. Modelling, Analysis, Verification, and Certification Second International Conference, RSSRail 2017, Pistoia, Italy, November 14-16, 2017, Proceedings
Author 
Fantechi, Alessandro. editor. Lecomte, Thierry. editor. Romanovsky, Alexander. editor. (orcid)0000-0002-4076-3331 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-68499-4
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3. 
Cover image for Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
Author 
Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-66266-4
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4. 
Cover image for Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
Author 
Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-66284-8
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5. 
Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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6. 
Cover image for Computer Safety, Reliability, and Security 35th International Conference, SAFECOMP 2016, Trondheim, Norway, September 21-23, 2016, Proceedings
Computer Safety, Reliability, and Security 35th International Conference, SAFECOMP 2016, Trondheim, Norway, September 21-23, 2016, Proceedings
Author 
Skavhaug, Amund. editor. Guiochet, Jérémie. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-45477-1
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7. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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8. 
Cover image for Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Author 
Pukite, Jan, 1928- Pukite, Paul.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338
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9. 
Cover image for Wireless Rechargeable Sensor Networks for Internet of Things Theories and Technical Paradigms
Wireless Rechargeable Sensor Networks for Internet of Things Theories and Technical Paradigms
Author 
Lin, Chi. author. (orcid)0000-0002-0302-5102 Sun, Yu. author. (orcid)0000-0002-2823-8251 Yang, Wei. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-9543-7
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10. 
Cover image for Proceedings of the 7th International Conference on Electrical, Control and Computer Engineering-Volume 2 InECCE 2023, Kuala Lumpur, Malaysia
Proceedings of the 7th International Conference on Electrical, Control and Computer Engineering-Volume 2 InECCE 2023, Kuala Lumpur, Malaysia
Author 
Md. Zain, Zainah. editor. Sulaiman, Norizam. editor. Mustafa, Mahfuzah. editor. (orcid)0000-0002-4909-7101 Shakib, Mohammed Nazmus. editor. A. Jabbar, Waheb. editor.
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https://doi.org/10.1007/978-981-97-3851-9
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11. 
Cover image for Proceedings of the 7th International Conference on Electrical, Control and Computer Engineering-Volume 1 InECCE 2023, Kuala Lumpur, Malaysia
Proceedings of the 7th International Conference on Electrical, Control and Computer Engineering-Volume 1 InECCE 2023, Kuala Lumpur, Malaysia
Author 
Md. Zain, Zainah. editor. Sulaiman, Norizam. editor. Mustafa, Mahfuzah. editor. (orcid)0000-0002-4909-7101 Shakib, Mohammed Nazmus. editor. Jabbar, Waheb A. editor.
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https://doi.org/10.1007/978-981-97-3847-2
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12. 
Cover image for Parallel Computing Technologies 14th International Conference, PaCT 2017, Nizhny Novgorod, Russia, September 4-8, 2017, Proceedings
Parallel Computing Technologies 14th International Conference, PaCT 2017, Nizhny Novgorod, Russia, September 4-8, 2017, Proceedings
Author 
Malyshkin, Victor. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-62932-2
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