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1. 
Cover image for Pattern Recognition Applications and Methods International Conference, ICPRAM 2013 Barcelona, Spain, February 15-18, 2013 Revised Selected Papers
Pattern Recognition Applications and Methods International Conference, ICPRAM 2013 Barcelona, Spain, February 15-18, 2013 Revised Selected Papers
Author 
Fred, Ana. editor. De Marsico, Maria. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-12610-4
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2. 
Cover image for Pattern Recognition Applications and Methods 6th International Conference, ICPRAM 2017, Porto, Portugal, February 24–26, 2017, Revised Selected Papers
Pattern Recognition Applications and Methods 6th International Conference, ICPRAM 2017, Porto, Portugal, February 24–26, 2017, Revised Selected Papers
Author 
De Marsico, Maria. editor. di Baja, Gabriella Sanniti. editor. Fred, Ana. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-93647-5
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3. 
Cover image for Pattern Recognition - Applications and Methods International Conference, ICPRAM 2012 Vilamoura, Algarve, Portugal, February 6-8, 2012 Revised Selected Papers
Pattern Recognition - Applications and Methods International Conference, ICPRAM 2012 Vilamoura, Algarve, Portugal, February 6-8, 2012 Revised Selected Papers
Author 
Latorre Carmona, Pedro. editor. Sánchez, J. Salvador. editor. Fred, Ana L.N. editor. SpringerLink (Online service)
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ONLINE(334227.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-36530-0
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4. 
Cover image for Biomedical Engineering Systems and Technologies 5th International Joint Conference, BIOSTEC 2012, Vilamoura, Portugal, February 1-4, 2012, Revised Selected Papers
Biomedical Engineering Systems and Technologies 5th International Joint Conference, BIOSTEC 2012, Vilamoura, Portugal, February 1-4, 2012, Revised Selected Papers
Author 
Gabriel, Joaquim. editor. Schier, Jan. editor. Huffel, Sabine. editor. Conchon, Emmanuel. editor. Correia, Carlos. editor.
Preferred Shelf Number 
ONLINE(334569.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-38256-7
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5. 
Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Author 
Yeung, Dit-Yan. editor. Kwok, James T. editor. Fred, Ana. editor. Roli, Fabio. editor. Ridder, Dick. editor.
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11815921
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