Limit Search Results
Author
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow
Digital integrated circuits : design-for-test using Simulink and Stateflow
Author 
Perelroyzen, Evgeni.
Preferred Shelf Number 
TK7874 .P445 2007
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
2. 
Cover image for Digital systems testing and testable design
Digital systems testing and testable design
Author 
Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
Format: 
Availability 
Online Library~1
Available:
Copies: