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1. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
Author 
Wong, Terence K. S.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
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2. 
Cover image for CVD of compound semiconductors precursor synthesis, development and applications
CVD of compound semiconductors precursor synthesis, development and applications
Author 
Jones, Anthony C. O'Brien, Paul (University lecturer) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527614639
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Online Library~1
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