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1. 
Cover image for Radiometric temperature measurements
Radiometric temperature measurements
Author 
Zhang, Zhuomin M. Tsai, Benjamin K. Machin, Graham.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123740212
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2. 
Cover image for Radiometric temperature measurements
Radiometric temperature measurements
Author 
Zhang, Zhuomin M. Tsai, Benjamin K. Machin, Graham.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123740212
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3. 
Cover image for High-Temperature Measurements of Materials
High-Temperature Measurements of Materials
Author 
Fukuyama, Hiroyuki. editor. Waseda, Yoshio. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85918-5
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4. 
Cover image for Modern Gas-Based Temperature and Pressure Measurements
Modern Gas-Based Temperature and Pressure Measurements
Author 
Pavese, Franco. author. Molinar Min Beciet, Gianfranco. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(330836.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8282-7
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5. 
Cover image for Fundamentals of temperature, pressure, and flow measurements
Fundamentals of temperature, pressure, and flow measurements
Author 
Benedict, Robert P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470172698
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/83023558.html
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/10207914.html
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6. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Author 
Boutier, A. (Alain)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library Click here to view book
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Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847
John Wiley http://dx.doi.org/10.1002/9781118576847
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7. 
Cover image for Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing
Experimental techniques for low-temperature measurements cryostat design, material properties, and superconductor critical-current testing
Author 
Ekin, J. W.
Preferred Shelf Number 
ONLINE
Electronic Access 
Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780198570547.001.0001
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8. 
Cover image for High-temperature superconductivity in cuprates : the nonlinear mechanism and tunneling measurements
High-temperature superconductivity in cuprates : the nonlinear mechanism and tunneling measurements
Author 
Mourachkine, Andrei.
Preferred Shelf Number 
QC611.98.C64 M68 2002
Format: 
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9. 
Cover image for Temperature measurements in seeded air and nitrogen plasmas
Temperature measurements in seeded air and nitrogen plasmas
Author 
Olsen, Harry Norman, 1920- Bedjai, G., ort. yaz. Kelly, F. L., ort. yaz.
Preferred Shelf Number 
QC 718 O47 1970
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10. 
Cover image for Numerical Methods and Applications 10th International Conference, NMA 2022, Borovets, Bulgaria, August 22-26, 2022, Proceedings
Numerical Methods and Applications 10th International Conference, NMA 2022, Borovets, Bulgaria, August 22-26, 2022, Proceedings
Author 
Georgiev, Ivan. editor. Datcheva, Maria. editor. Georgiev, Krassimir. editor. Nikolov, Geno. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520863.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-32412-3
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11. 
Cover image for Single-atom nanoelectronics
Single-atom nanoelectronics
Author 
Prati, Enrico. Shinada, Takahiro.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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12. 
Cover image for Thermal measurements and inverse techniques
Thermal measurements and inverse techniques
Author 
Orlande, Helcio R. B., 1965-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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