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1. 
Cover image for Integration of methods improvement and measurement into industrial engineering functions
Integration of methods improvement and measurement into industrial engineering functions
Author 
Watson, Gerald J., Jr., author. Derouin, Jesse J., illustrator.
Preferred Shelf Number 
T57.6
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003153412
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for 6th EAI International Conference on Management of Manufacturing Systems
6th EAI International Conference on Management of Manufacturing Systems
Author 
Knapčíková, Lucia. editor. (orcid)0000-0003-1925-4038 Peraković, Dragan. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-96314-9
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3. 
Cover image for Modular System Design and Evaluation
Modular System Design and Evaluation
Author 
Levin, Mark Sh. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-09876-0
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4. 
Cover image for Handbook of Operations Research for Homeland Security
Handbook of Operations Research for Homeland Security
Author 
Herrmann, Jeffrey W. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331730.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5278-2
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5. 
Cover image for Engineering Risk and Finance
Engineering Risk and Finance
Author 
Tapiero, Charles S. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331980.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6234-7
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6. 
Cover image for Dimensionality Reduction with Unsupervised Nearest Neighbors
Dimensionality Reduction with Unsupervised Nearest Neighbors
Author 
Kramer, Oliver. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334643.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-38652-7
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7. 
Cover image for Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
Author 
Mönch, Lars. author. Fowler, John W. author. Mason, Scott J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331515.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4472-5
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8. 
Cover image for Risk Assessment and Management in the Networked Economy
Risk Assessment and Management in the Networked Economy
Author 
Hussain, Omar K. author. Dillon, Tharam S. author. Hussain, Farookh K. author. Chang, Elizabeth J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333196.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28690-2
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