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421. 
Cover image for Force Sensors for Microelectronic Packaging Applications
Force Sensors for Microelectronic Packaging Applications
Author 
Schwizer, Jürg. author. Mayer, Michael. author. Brand, Oliver. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138345
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422. 
Cover image for Physical Acoustics in the Solid State
Physical Acoustics in the Solid State
Author 
Lüthi, Bruno. author. Cardona, Manuel. editor. Klitzing, Klaus. editor. Queisser, Hans-Joachim. editor. Fulde, Peter. editor.
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http://dx.doi.org/10.1007/b138867
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423. 
Cover image for Ambient Intelligence
Ambient Intelligence
Author 
Weber, Werner. editor. Rabaey, Jan M. editor. Aarts, Emile. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138670
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424. 
Cover image for The Physics of Thin Film Optical Spectra An Introduction
The Physics of Thin Film Optical Spectra An Introduction
Author 
Stenzel, Olaf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27905-9
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425. 
Cover image for Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author 
Rein, Stefan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27922-9
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426. 
Cover image for Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
Applied Physics of Carbon Nanotubes Fundamentals of Theory, Optics and Transport Devices
Author 
Rotkin, Slava V. editor. Subramoney, Shekhar. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28075-8
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427. 
Cover image for Finite Element Methods and Their Applications
Finite Element Methods and Their Applications
Author 
Chen, Zhangxin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-28078-2
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428. 
Cover image for Modeling and Simulation for RF System Design
Modeling and Simulation for RF System Design
Author 
Frevert, Ronny. author. Haase, Joachim. author. Jancke, Roland. author. Knöchel, Uwe. author. Schwarz, Peter. author.
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http://dx.doi.org/10.1007/0-387-27585-1
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429. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3019-3
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430. 
Cover image for Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Author 
Vaseashta, A. editor. Dimova-Malinovska, D. editor. Marshall, J. M. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3562-4
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