Switch to list view
Switch to thumbnail view
6 Results Found Subscribe to search results
000000DEFAULT
Print
1. 
Cover image for Piezoceramic Sensors
Piezoceramic Sensors
Author 
Sharapov, Valeriy. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-15311-2
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Thermal Transport for Applications in Micro/Nanomachining
Thermal Transport for Applications in Micro/Nanomachining
Author 
Wong, Basil T. author. Mengüç, M. Pinar. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73607-3
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Capillary Forces in Microassembly Modeling, Simulation, Experiments, and Case Study
Capillary Forces in Microassembly Modeling, Simulation, Experiments, and Case Study
Author 
Lambert, Pierre. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71089-1
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Force Sensors for Microelectronic Packaging Applications
Force Sensors for Microelectronic Packaging Applications
Author 
Schwizer, Jürg. author. Mayer, Michael. author. Brand, Oliver. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138345
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Integrated Chemical Microsensor Systems in CMOS Technology
Integrated Chemical Microsensor Systems in CMOS Technology
Author 
Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138987
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
Author 
Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139047
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets