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1. 
Cover image for VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author 
Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-5950-7
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2. 
Cover image for Security, Privacy, and Applied Cryptography Engineering 9th International Conference, SPACE 2019, Gandhinagar, India, December 3–7, 2019, Proceedings
Security, Privacy, and Applied Cryptography Engineering 9th International Conference, SPACE 2019, Gandhinagar, India, December 3–7, 2019, Proceedings
Author 
Bhasin, Shivam. editor. (orcid)0000-0002-6903-5127 Mendelson, Avi. editor. Nandi, Mridul. editor. (orcid)0000-0002-1029-6576 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-35869-3
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3. 
Cover image for VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author 
Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9767-8
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4. 
Cover image for Security, Privacy, and Applied Cryptography Engineering 8th International Conference, SPACE 2018, Kanpur, India, December 15-19, 2018, Proceedings
Security, Privacy, and Applied Cryptography Engineering 8th International Conference, SPACE 2018, Kanpur, India, December 15-19, 2018, Proceedings
Author 
Chattopadhyay, Anupam. editor. (orcid)0000-0002-8818-6983 Rebeiro, Chester. editor. (orcid)0000-0001-8063-0026 Yarom, Yuval. editor. (orcid)0000-0003-0401-4197 SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-030-05072-6
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5. 
Cover image for VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Author 
Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.
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ONLINE(335156.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-42024-5
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6. 
Cover image for Advances in Power Electronics and Instrumentation Engineering Second International Conference, PEIE 2011, Nagpur, Maharashtra, India, April 21-22, 2011. Proceedings
Advances in Power Electronics and Instrumentation Engineering Second International Conference, PEIE 2011, Nagpur, Maharashtra, India, April 21-22, 2011. Proceedings
Author 
Das, Vinu V. editor. Thankachan, Nessy. editor. Debnath, Narayan C. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-20499-9
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7. 
Cover image for Power Electronics and Instrumentation Engineering International Conference, PEIE 2010, Kochi, Kerala, India, September 7-9, 2010. Proceedings
Power Electronics and Instrumentation Engineering International Conference, PEIE 2010, Kochi, Kerala, India, September 7-9, 2010. Proceedings
Author 
Das, Vinu V. editor. Stephen, Janahanlal. editor. Thankachan, Nessy. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-642-15739-4
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