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1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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2. 
Cover image for CMOS Test and Evaluation A Physical Perspective
CMOS Test and Evaluation A Physical Perspective
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-1349-7
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3. 
Cover image for Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
Author 
Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-98965-5
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4. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-2493-2
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5. 
Cover image for Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques
Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques
Author 
Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-02964-7
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6. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-02378-6
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7. 
Cover image for The science of sound recording
The science of sound recording
Author 
Kadis, Jay. Brown, Pat, 1957- Test and measurement.
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Click here to view
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8. 
Cover image for Cloud Computing with Security and Scalability. Concepts and Practices
Cloud Computing with Security and Scalability. Concepts and Practices
Author 
Sehgal, Naresh Kumar. author. Bhatt, Pramod Chandra P. author. Acken, John M. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-07242-0
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9. 
Cover image for Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
Author 
Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-0055-8
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10. 
Cover image for Machine Learning Support for Fault Diagnosis of System-on-Chip
Machine Learning Support for Fault Diagnosis of System-on-Chip
Author 
Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-19639-3
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11. 
Cover image for Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
Author 
Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-1-4939-1556-9
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12. 
Cover image for Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
Author 
Ohnhäuser, Frank. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-662-47020-6
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