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1. 
Cover image for Understanding electromagnetic transients in power systems
Understanding electromagnetic transients in power systems
Author 
Zanetta Júnior, Luiz Cera, author.
Preferred Shelf Number 
TK3226 .Z36 2025
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394240586
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2. 
Cover image for Modern characterization of electromagnetic systems and its associated metrology
Modern characterization of electromagnetic systems and its associated metrology
Author 
Sarkar, Tapan (Tapan K.), editor. Salazar-Palma, Magdalena, editor. Zhu, Ming Da, editor. Chen, Heng, 1990- editor.
Preferred Shelf Number 
QC760 .M53 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119076230
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3. 
Cover image for Foundations of pulsed power technology
Foundations of pulsed power technology
Author 
Lehr, Janet, author. Ron, Pralhad, author.
Preferred Shelf Number 
TK2986
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781118886502
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4. 
Cover image for Piezo-Electric Electro-Acoustic Transducers
Piezo-Electric Electro-Acoustic Transducers
Author 
Sharapov, Valeriy. author. Sotula, Zhanna. author. Kunickaya, Larisa. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-01198-1
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5. 
Cover image for Inside Solid State Drives (SSDs)
Inside Solid State Drives (SSDs)
Author 
Micheloni, Rino. author. Marelli, Alessia. author. Eshghi, Kam. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335898.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-5146-0
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6. 
Cover image for High Mobility and Quantum Well Transistors Design and TCAD Simulation
High Mobility and Quantum Well Transistors Design and TCAD Simulation
Author 
Hellings, Geert. author. De Meyer, Kristin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336218.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6340-1
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7. 
Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author 
Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336233.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6392-0
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8. 
Cover image for Factors Governing Tin Whisker Growth
Factors Governing Tin Whisker Growth
Author 
Crandall, Erika R. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332756.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00470-9
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9. 
Cover image for Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits
Author 
Wirnshofer, Martin. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(336184.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-6196-4
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