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505. 
Cover image for SystemC: From the Ground Up
SystemC: From the Ground Up
Author 
Black, David C. author. Donovan, Jack. author. Bunton, Bill. author. Keist, Anna. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69958-5
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506. 
Cover image for Multi-Wafer Rotating MEMS Machines Turbines, Generators, and Engines
Multi-Wafer Rotating MEMS Machines Turbines, Generators, and Engines
Author 
Lang, Jeffrey. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-77747-4
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507. 
Cover image for Electrical Conductive Adhesives with Nanotechnologies
Electrical Conductive Adhesives with Nanotechnologies
Author 
Li, Yi. author. Lu, Daniel. author. Wong, C. P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-88783-8
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508. 
Cover image for Wireless Communication in Underground Mines RFID-Based Sensor Networking
Wireless Communication in Underground Mines RFID-Based Sensor Networking
Author 
Bandyopadhyay, L. K. author. Chaulya, S. K. author. Mishra, P. K. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-98165-9
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509. 
Cover image for Analog and Digital Signals and Systems
Analog and Digital Signals and Systems
Author 
Yarlagadda, R. K. Rao. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0034-0
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510. 
Cover image for Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Author 
Kuon, Ian. author. Rose, Jonathan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0739-4
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511. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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512. 
Cover image for Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations
Author 
Garg, Rajesh. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0931-2
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513. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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http://dx.doi.org/10.1007/978-1-4419-0938-1
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514. 
Cover image for Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
Designing Embedded Systems with the SIGNAL Programming Language Synchronous, Reactive Specification
Author 
Gamatie, Abdoulaye. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0941-1
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515. 
Cover image for Hardware Acceleration of EDA Algorithms Custom ICs, FPGAs and GPUs
Hardware Acceleration of EDA Algorithms Custom ICs, FPGAs and GPUs
Author 
Gulati, Kanupriya. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0944-2
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516. 
Cover image for On and Off-Chip Crosstalk Avoidance in VLSI Design
On and Off-Chip Crosstalk Avoidance in VLSI Design
Author 
Duan, Chunjie. author. LaMeres, Brock J. author. Khatri, Sunil P. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0947-3
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