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109. 
Cover image for Internet networks wired, wireless, and optical technologies
Internet networks wired, wireless, and optical technologies
Author 
Iniewski, Krzysztof.
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110. 
Cover image for Radiation effects in semiconductors
Radiation effects in semiconductors
Author 
Iniewski, Krzysztof.
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111. 
Cover image for Carbon Nanotube Electronics
Carbon Nanotube Electronics
Author 
Kong, Jing. editor. Javey, Ali. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69285-2
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112. 
Cover image for Low Power Design Essentials
Low Power Design Essentials
Author 
Rabaey, Jan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71713-5
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113. 
Cover image for Organic Field Effect Transistors Theory, Fabrication and Characterization
Organic Field Effect Transistors Theory, Fabrication and Characterization
Author 
Kymissis, Ioannis. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-92134-1
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114. 
Cover image for Clocking in Modern VLSI Systems
Clocking in Modern VLSI Systems
Author 
Xanthopoulos, Thucydides. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0261-0
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115. 
Cover image for Multicore Processors and Systems
Multicore Processors and Systems
Author 
Keckler, Stephen W. editor. Olukotun, Kunle. editor. Hofstee, H. Peter. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0263-4
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116. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
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Zhang, Kevin. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-88497-4
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117. 
Cover image for Nanotechnologies
Nanotechnologies
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Wautelet, M. nanomagnetism
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http://dx.doi.org/10.1049/PBCS022E
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118. 
Cover image for Wafer Level 3-D ICs Process Technology
Wafer Level 3-D ICs Process Technology
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Tan, Chuan Seng. editor. Gutmann, Ronald J. editor. Reif, L. Rafael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-76534-1
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119. 
Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Author 
Yichuang Sun, ed.
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http://dx.doi.org/10.1049/PBCS019E
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120. 
Cover image for Wideband Amplifier Design
Wideband Amplifier Design
Author 
Hollister, A L
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http://dx.doi.org/10.1049/SBCS010E
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