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517. 
Cover image for Design for embedded image processing on FPGAs
Design for embedded image processing on FPGAs
Author 
Bailey, Donald G. (Donald Graeme), 1962-
Preferred Shelf Number 
TK7895 .E42 B3264 2011 EB
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119819820
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518. 
Cover image for Complex and dusty plasmas : from laboratory to space
Complex and dusty plasmas : from laboratory to space
Author 
Fortov, V. E. Morfill, G. E.
Preferred Shelf Number 
QC718.5 .D84 C66 2010
Electronic Access 
Taylor & Francis http://www.taylorfrancis.com/books/9781420083125
Taylor & Francis https://www.taylorfrancis.com/books/9781420083125
Taylor & Francis https://www.taylorfrancis.com/books/9780367802882
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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519. 
Cover image for Design of cost-efficient interconnect processing units : Spidergon STNoC
Design of cost-efficient interconnect processing units : Spidergon STNoC
Author 
Coppola, Marcello.
Preferred Shelf Number 
TK5105.546 .D47 2009
Electronic Access 
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520. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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521. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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522. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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523. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
TK7871 .D44 2009
Electronic Access 
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524. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
Electronic Access 
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525. 
Cover image for Microelectronic applications of chemical mechanical planarization
Microelectronic applications of chemical mechanical planarization
Author 
Li, Yuzhuo. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0742/2007015557-b.html
John Wiley http://dx.doi.org/10.1002/9780470180907
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526. 
Cover image for Digital systems and applications
Digital systems and applications
Author 
Oklobdzija, Vojin G.
Preferred Shelf Number 
TK7885 .D56 2008
Electronic Access 
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527. 
Cover image for Optical inspection of microsystems
Optical inspection of microsystems
Author 
Osten, Wolfgang.
Preferred Shelf Number 
TS156.2 .O652 2007
Electronic Access 
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528. 
Cover image for Electron beams and microwave vacuum electronics
Electron beams and microwave vacuum electronics
Author 
Tsimring, Shulim E., 1924-
Preferred Shelf Number 
ONLINE
Electronic Access 
Click for information
http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9780470053768
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=275883
John Wiley http://dx.doi.org/10.1002/0470053763
John Wiley http://dx.doi.org/10.1002/9780470053768
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