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277. 
Cover image for Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis
Author 
Limnios, Nikolaos. author. Barbu, Vlad Stefan. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-73173-5
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278. 
Cover image for Engineering design reliability applications for the aerospace, automotive, and ship industries
Engineering design reliability applications for the aerospace, automotive, and ship industries
Author 
Nikolaidis, Efstratios. Ghiocel, Dan M. Singhal, Suren. CRC Press.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=202483
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279. 
Cover image for Developments in Telecommunications With a Focus on SS7 Network Reliability
Developments in Telecommunications With a Focus on SS7 Network Reliability
Author 
Rufa, Gerhard. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-74986-8
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280. 
Cover image for Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings
Computer Safety, Reliability, and Security 27th International Conference, SAFECOMP 2008 Newcastle upon Tyne, UK, September 22-25, 2008 Proceedings
Author 
Harrison, Michael D. editor. Sujan, Mark-Alexander. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-87698-4
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281. 
Cover image for Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
Reliability in Automotive and Mechanical Engineering Determination of Component and System Reliability
Author 
Bertsche, Bernd. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-3-540-34282-3
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282. 
Cover image for Reliability technology, human error, and quality in health care
Reliability technology, human error, and quality in health care
Author 
Dhillon, B. S. (Balbir S.), 1947-
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283. 
Cover image for Mathematical methods in survival analysis, reliability and quality of life
Mathematical methods in survival analysis, reliability and quality of life
Author 
Huber, Catherine.
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625
John Wiley http://dx.doi.org/10.1002/9780470610985
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html
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284. 
Cover image for Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n
Next Generation Wireless LANs Throughput, Robustness, and Reliability in 802.11n
Author 
Perahia, Eldad. Stacey, Robert.
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Access by subscription
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285. 
Cover image for Tutorial on hardware and software reliability, maintainability, and availability
Tutorial on hardware and software reliability, maintainability, and availability
Author 
Schneidewind, Norman.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769540
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5769540
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286. 
Cover image for Lubrication and maintenance of industrial machinery best practices and reliability
Lubrication and maintenance of industrial machinery best practices and reliability
Author 
Gresham, Robert M. Totten, George E.
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287. 
Cover image for Risk-based reliability analysis and generic principles for risk reduction
Risk-based reliability analysis and generic principles for risk reduction
Author 
Todinov, M. T.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080447285
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288. 
Cover image for Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
Author 
Suhir, E. editor. Lee, Y. C. editor. Wong, C. P. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-32989-7
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