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1477. 
Cover image for Edgar Allan Poe in context
Edgar Allan Poe in context
Author 
Hayes, Kevin J., editor.
Preferred Shelf Number 
PS2638 .E345 2013
Electronic Access 
https://doi.org/10.1017/CBO9780511844027
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1478. 
Cover image for Fundamentals of Nanoscaled Field Effect Transistors
Fundamentals of Nanoscaled Field Effect Transistors
Author 
Chaudhry, Amit. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332128.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6822-6
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1479. 
Cover image for Silicon-based Nanomaterials
Silicon-based Nanomaterials
Author 
Li, Handong. editor. Wu, Jiang. editor. Wang, Zhiming M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332396.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8169-0
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1480. 
Cover image for Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Author 
Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332321.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7675-7
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1481. 
Cover image for Helium Ion Microscopy Principles and Applications
Helium Ion Microscopy Principles and Applications
Author 
Joy, David C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332438.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8660-2
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1482. 
Cover image for Local Electrode Atom Probe Tomography A User's Guide
Local Electrode Atom Probe Tomography A User's Guide
Author 
Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.
Preferred Shelf Number 
ONLINE(332444.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-8721-0
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1483. 
Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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1484. 
Cover image for Biomimetic Dye Aggregate Solar Cells
Biomimetic Dye Aggregate Solar Cells
Author 
Marek, Peter L. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332784.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00636-9
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1485. 
Cover image for From Environmental to Comprehensive Security
From Environmental to Comprehensive Security
Author 
Westing, Arthur H. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332789.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00687-1
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1486. 
Cover image for UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterization
UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterization
Author 
Kumar, Challa. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333157.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-27594-4
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1487. 
Cover image for Textbook of Nanoscience and Nanotechnology
Textbook of Nanoscience and Nanotechnology
Author 
Murty, B.S. author. Shankar, P. author. Raj, Baldev. author. Rath, B B. author. Murday, James. author.
Preferred Shelf Number 
ONLINE(333172.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28030-6
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1488. 
Cover image for Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Author 
Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333183.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28424-3
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