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181. 
Cover image for Internal Photoemission Spectroscopy Fundamentals and Recent Advances.
Internal Photoemission Spectroscopy Fundamentals and Recent Advances.
Author 
Afanas'ev, Valeri V.
Preferred Shelf Number 
ONLINE(355940.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080999296
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182. 
Cover image for Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications
Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications
Author 
Zhuiykov, Serge, author.
Preferred Shelf Number 
ONLINE(355966.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781782422204
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183. 
Cover image for Integrated power devices and TCAD simulation
Integrated power devices and TCAD simulation
Author 
Fu, Yue (Electrical engineer), author. Li, Zhanming, author. Ng, Wai Tung, author. Sin, Johnny K. O., author.
Preferred Shelf Number 
ONLINE(356761.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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184. 
Cover image for High performance silicon imaging : fundamentals and applications CMOS and CCD sensors
High performance silicon imaging : fundamentals and applications CMOS and CCD sensors
Author 
Durini, Daniel, editor.
Preferred Shelf Number 
ONLINE(355761.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780857095985
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185. 
Cover image for Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Author 
Mathew, Jimson. editor. Shafik, Rishad A. editor. Pradhan, Dhiraj K. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-4193-9
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186. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-01165-3
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187. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-94-007-6082-0
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188. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-54795-2
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189. 
Cover image for Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Author 
Kimoto, Tsunenobu, 1963- author. Cooper, James A., 1946- author.
Preferred Shelf Number 
ONLINE(341501.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118313534
Safari Books Online http://proquest.safaribooksonline.com/?fpi=9781118313558
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190. 
Cover image for Metal chalcogenide nanostructures for renewable energy applications
Metal chalcogenide nanostructures for renewable energy applications
Author 
Qurashi, Ahsanulhaq, editor.
Preferred Shelf Number 
ONLINE(342154.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1866801
John Wiley http://dx.doi.org/10.1002/9781119008934
MyiLibrary http://www.myilibrary.com?id=674938
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191. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
ONLINE(342881.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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192. 
Cover image for Electrical overstress (EOS) : devices, circuits, and systems
Electrical overstress (EOS) : devices, circuits, and systems
Author 
Voldman, Steven H.
Preferred Shelf Number 
TK7871.852 V648 2014
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