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1. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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2. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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3. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
Electronic Access 
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4. 
Cover image for Future trends in microelectronics up the nano creek
Future trends in microelectronics up the nano creek
Author 
FTM-5 (2006 : Crete, Greece) Luryi, Serge. Xu, Jimmy. Zaslavsky, Alex, 1963-
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522
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5. 
Cover image for Managing power electronics VLSI and DSP-driven computer systems
Managing power electronics VLSI and DSP-driven computer systems
Author 
Rossetti, Nazzareno, 1951-
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236490
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6. 
Cover image for The physical properties of thin metal films
The physical properties of thin metal films
Author 
Zhigal'skii, G. P., editor. Jones, Brian K., 1938- editor.
Preferred Shelf Number 
TN690 .Z458 2003 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367801113
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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