Limit Search Results
Author
SpringerLink (Online service)
(19)
Collège français de métrologie.
(2)
Gåsvik, Kjell J.
(2)
John Wiley & Sons.
(2)
Leach, R. K.
(2)
Language
Publication Date
-
Subject
Engineering.
(8)
Metrology.
(8)
Electronic books.
(7)
Nanotechnology.
(5)
Optical measurements.
(4)
Material Type
Library
Switch to list view
Switch to thumbnail view
58 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Metrology
Metrology
Author 
Gao, Wei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-10-4938-5
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Mass Metrology
Mass Metrology
Author 
Gupta, S. V. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-23412-5
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0470855606
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
Preferred Shelf Number 
ONLINE(318819.1)
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534
MyiLibrary http://www.myilibrary.com?id=26972
John Wiley http://dx.doi.org/10.1002/0470855606
Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Speckle metrology
Speckle metrology
Author 
Erf, Robert K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
Author 
Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html
John Wiley http://dx.doi.org/10.1002/3527602992
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
Author 
Horn, Alexander, PD Dr.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071
John Wiley http://dx.doi.org/10.1002/9783527627929
http://site.ebrary.com/lib/alltitles/Doc?id=10332978
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
Author 
Harding, Kevin G.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
Author 
Le Menn, Marc.
Preferred Shelf Number 
ONLINE
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9781118561959
Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html
ebrary http://site.ebrary.com/id/10684971
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
Author 
Wong, Terence K. S.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
Author 
Osten, Wolfgang. Reingand, Nadya.
Preferred Shelf Number 
ONLINE
Electronic Access 
Connect to MyiLibrary resource.
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916
Wiley http://dx.doi.org/10.1002/9783527648443
http://site.ebrary.com/lib/alltitles/Doc?id=10575536
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2167-1
Format: 
Availability 
Online Library~1
Available:
Copies:
Go to:Search Results
|
Top of Page
|
Search Facets