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1. 
Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
The theory and applications of reliability with emphasis on Bayesian and nonparametric methods
Author 
Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780127021010
Format: 
Availability 
Online Library~1
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2. 
Cover image for Reliability and degradation of semiconductor lasers and LEDs
Reliability and degradation of semiconductor lasers and LEDs
Author 
Fukuda, Mitsuo.
Preferred Shelf Number 
TA 1700 F85 1991
Format: 
Availability 
Beytepe Library~1
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3. 
Cover image for Statistical methods for the process industries
Statistical methods for the process industries
Author 
McNeese, William H. Klein, Robert Allan, 1947- ort. yaz.
Preferred Shelf Number 
TS 156.8 M42 1991
Format: 
Availability 
Beytepe Library~1
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4. 
Cover image for Evaluation and control of measurements
Evaluation and control of measurements
Author 
Mandel, John.
Preferred Shelf Number 
QA 276 M326 1991 1.K
Format: 
Availability 
Health Sciences Library~1
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