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Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
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Collège français de métrologie. Wiley InterScience (Online service)
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Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
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Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
http://site.ebrary.com/lib/alltitles/Doc?id=10360928
http://swb.eblib.com/patron/FullRecord.aspx?p=477706
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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