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1. 
Cover image for The statistical analysis of failure time data
The statistical analysis of failure time data
Author 
Kalbfleisch, J. D. Prentice, Ross L.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118032985
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html
http://swb.eblib.com/patron/FullRecord.aspx?p=708259
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2. 
Cover image for The Statistical Analysis of Interval-censored Failure Time Data
The Statistical Analysis of Interval-censored Failure Time Data
Author 
Sun, Jianguo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37119-2
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3. 
Cover image for Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papers
Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papers
Author 
Wen, Shiping. editor. Yang, Cihui. editor. SpringerLink (Online service)
Preferred Shelf Number 
XX(520804.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-25191-7
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4. 
Cover image for Interval-censored time-to-event data methods and applications
Interval-censored time-to-event data methods and applications
Author 
Chen, Ding-Geng. Sun, Jianguo, 1961- Peace, Karl E., 1941-
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ONLINE
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5. 
Cover image for Multivariate survival analysis and competing risks
Multivariate survival analysis and competing risks
Author 
Crowder, M. J. (Martin J.), 1943-
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ONLINE
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6. 
Cover image for Frailty models in survival analysis
Frailty models in survival analysis
Author 
Wienke, Andreas.
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ONLINE
Electronic Access 
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7. 
Cover image for Mathematical methods in survival analysis, reliability and quality of life
Mathematical methods in survival analysis, reliability and quality of life
Author 
Huber, Catherine.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625
John Wiley http://dx.doi.org/10.1002/9780470610985
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html
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8. 
Cover image for Counting processes and survival analysis
Counting processes and survival analysis
Author 
Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Spis treści http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html
ebrary http://site.ebrary.com/id/10509867
http://site.ebrary.com/lib/alltitles/Doc?id=10509867
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9. 
Cover image for Accelerated testing and validation testing, engineering, and management tools for lean development
Accelerated testing and validation testing, engineering, and management tools for lean development
Author 
Porter, Alex.
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ONLINE
Electronic Access 
Volltext http://www.sciencedirect.com/science/book/9780750676533
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10. 
Cover image for Statistical methods for survival data analysis
Statistical methods for survival data analysis
Author 
Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0471458546
http://www3.interscience.wiley.com/cgi-bin/bookhome/104543139
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html
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11. 
Cover image for Statistical models and methods for lifetime data
Statistical models and methods for lifetime data
Author 
Lawless, Jerald F., 1944-
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118033005
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html
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12. 
Cover image for Classical competing risks
Classical competing risks
Author 
Crowder, M. J. (Martin J.), 1943-
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13. 
Cover image for Subjective probability models for lifetimes
Subjective probability models for lifetimes
Author 
Spizzichino, F. (Fabio), 1948-
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14. 
Cover image for Environmental requirements for electromechanical and electronic equipment
Environmental requirements for electromechanical and electronic equipment
Author 
Tricker, Ray. Tricker, Samantha.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750639026
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15. 
Cover image for Accelerated testing statistical models, test plans and data analyses
Accelerated testing statistical models, test plans and data analyses
Author 
Nelson, Wayne, 1936-
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
John Wiley http://dx.doi.org/10.1002/9780470316795
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html
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