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1. 
Cover image for Instruments and measurements chemical analysis, electric quantities, nucleonics and process control
Instruments and measurements chemical analysis, electric quantities, nucleonics and process control
Author 
Koch, Helge von, 1925-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123956064
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2. 
Cover image for Critical Information Infrastructures Security 17th International Conference, CRITIS 2022, Munich, Germany, September 14-16, 2022, Revised Selected Papers
Critical Information Infrastructures Security 17th International Conference, CRITIS 2022, Munich, Germany, September 14-16, 2022, Revised Selected Papers
Author 
Hämmerli, Bernhard. editor. (orcid) Helmbrecht, Udo. editor. Hommel, Wolfgang. editor. Kunczik, Leonhard. editor. Pickl, Stefan. editor.
Preferred Shelf Number 
XX(520990.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-35190-7
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3. 
Cover image for Electromagnetic Measurements in the Near Field
Electromagnetic Measurements in the Near Field
Author 
Bienkowski, Pawel Duffy, Alastair, ed. Trzaska, Hubert
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ONLINE
Electronic Access 
http://dx.doi.org/10.1049/SBEW042E
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4. 
Cover image for Coaxial Electrical Circuits for Interference-Free Measurements
Coaxial Electrical Circuits for Interference-Free Measurements
Author 
Awan, Shakil Kibble, Bryan Schurr, J�rg
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL013E
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5. 
Cover image for Principles of electrical measurement
Principles of electrical measurement
Author 
Tuma?ski, S?awomir.
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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6. 
Cover image for Electrical measurement, signal processing, and displays
Electrical measurement, signal processing, and displays
Author 
Webster, John G., 1932-
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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7. 
Cover image for Voltage references from diodes to precision high-order bandgap circuits
Voltage references from diodes to precision high-order bandgap circuits
Author 
Rincón-Mora, Gabriel A. (Gabriel Alfonso)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5270959
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8. 
Cover image for High Voltage Engineering and Testing
High Voltage Engineering and Testing
Author 
Ryan, Hugh M., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBPO032E
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9. 
Cover image for Measuring current, voltage, and power
Measuring current, voltage, and power
Author 
Iwansson, Kaj. Sinapius, Günther. Hoornaert, Winfried.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444720016
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10. 
Cover image for The story of electrical and magnetic measurements from 500 B.C. to the 1940s
The story of electrical and magnetic measurements from 500 B.C. to the 1940s
Author 
Keithley, Joseph F.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265284
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11. 
Cover image for Electronic Applications of the Smith Chart
Electronic Applications of the Smith Chart
Author 
Smith, Phillip H.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/SBEW003E
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12. 
Cover image for Radio Frequency and Microwave Power Measurement
Radio Frequency and Microwave Power Measurement
Author 
Fantom, A.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL007E
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13. 
Cover image for The Current Comparator
The Current Comparator
Author 
Moore, W. J. Miljanic, P. N.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBEL004E
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